Languages
Forbes, Richard G.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Atom probe tomographythe local electrode atom probe /
by:
Forbes, Richard G.; Miller, Michael K.; SpringerLink (Online service)
(Electronic resources)
Modern developments in vacuum electron sources
by:
Forbes, Richard G.; Gaertner, Georg.; Knapp, Wolfram.; SpringerLink (Online service)
(Electronic resources)
Subjects
Atom-probe field ion microscopy.
Solid State Physics.
Nanotechnology.
Electronics.
Microelectronics.
Electronics and Microelectronics, Instrumentation.
Spectroscopy and Microscopy.
Materials Science.
Vacuum microelectronics.
Field emission.
Measurement Science and Instrumentation.
Characterization and Evaluation of Materials.
Tomography.