語系
Celano, Umberto.
概要
作品: | 2 作品在 2 項出版品 1 種語言 |
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書目資訊
Electrical atomic force microscopy for nanoelectronics
by:
Celano, Umberto.; SpringerLink (Online service)
(書目-電子資源)
Metrology and physical mechanisms in new generation ionic devices
by:
Celano, Umberto.; SpringerLink (Online service)
(書目-電子資源)
主題
Nanoscale Science and Technology.
Nanotechnology.
Electronics and Microelectronics, Instrumentation.
Electronic apparatus and appliances.
Nonvolatile random-access memory.
Spectroscopy and Microscopy.
Atomic force microscopy.
Nanotechnology and Microengineering.
Thin films.
Physics.
Characterization and Evaluation of Materials.
Nanoelectronics.
Optical and Electronic Materials.
Metrology.