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From contamination to defects, fault...

Khare, Jitendra B.

From contamination to defects, faults, and yield loss :simulation and applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	From contamination to defects, faults, and yield loss :by Jitendra B. Khare, Wojciech Maly.
其他題名:	simulation and applications /
作者:	Khare, Jitendra B.
其他作者:	Maly, W.
出版者:	Boston :Kluwer Academic Publishers,c1996.
面頁冊數:	150 p. :ill. ;24 cm.
叢書名:	Frontiers in electronic testing
標題:	Integrated circuitsVery large scale integration
ISBN:	0792397142 (acid-free paper) :

From contamination to defects, faults, and yield loss :simulation and applications /
Khare, Jitendra B.

From contamination to defects, faults, and yield loss :simulation and applications /by Jitendra B. Khare, Wojciech Maly. - Boston :Kluwer Academic Publishers,c1996. - 150 p. :ill. ;24 cm. - Frontiers in electronic testing.

Includes bibliographical references and index.

ISBN: 0792397142 (acid-free paper) :NT$3,500

LCCN: 96005441 Subjects--Topical Terms:

184609
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / K45 1996

Dewey Class. No.: 621.3815/2/0685

From contamination to defects, faults, and yield loss :simulation and applications /
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245 1 0 $a From contamination to defects, faults, and yield loss : $b simulation and applications / $c by Jitendra B. Khare, Wojciech Maly.
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650 $a Computer-aided design. $3 181931
700 $a Maly, W. $3 184607