• X-ray microdiffraction studies of mechanical behavior and electromigration in thin film structures.
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: X-ray microdiffraction studies of mechanical behavior and electromigration in thin film structures.
    作者: Valek, Bryan Charles.
    面頁冊數: 134 p.
    附註: Adviser: John C. Bravman.
    附註: Source: Dissertation Abstracts International, Volume: 64-09, Section: B, page: 4570.
    Contained By: Dissertation Abstracts International64-09B.
    標題: Engineering, Materials Science.
    電子資源: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3104171
    ISBN: 0496517392
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