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Single ion trapping for the Enriched...

Stanford University.

Single ion trapping for the Enriched Xenon Observatory.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Single ion trapping for the Enriched Xenon Observatory.
作者:	Waldman, Samuel J.
面頁冊數:	137 p.
附註:	Adviser: Georgio Gratta.
附註:	Source: Dissertation Abstracts International, Volume: 66-04, Section: B, page: 2134.
Contained By:	Dissertation Abstracts International66-04B.
標題:	Physics, Elementary Particles and High Energy.
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3171743
ISBN:	9780542086243

Single ion trapping for the Enriched Xenon Observatory.
Waldman, Samuel J.

Single ion trapping for the Enriched Xenon Observatory. - 137 p.

Adviser: Georgio Gratta.

Thesis (Ph.D.)--Stanford University, 2005.

In the last decade, a variety of neutrino oscillation experiments have established that there is a mass difference between neutrino flavors, without determining the absolute neutrino mass scale. The Enriched Xenon Observatory for neutrinoless double beta decay (EXO) will search for the rare decays of xenon to determine the absolute value of the neutrino mass. The experiment uses a novel technique to minimize backgrounds, identifying the decay daughter product in real time using single ion spectroscopy. Here, we describe single ion trapping and spectroscopy compatible with the EXO detector. We extend the technique of single ion trapping in ultrahigh vacuum to trapping in xenon gas. With this technique, EXO will achieve a neutrino mass sensitivity of &lang; mnu&rang; &sime; .010 eV.

ISBN: 9780542086243Subjects--Topical Terms:

227490
Physics, Elementary Particles and High Energy.

Single ion trapping for the Enriched Xenon Observatory.
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