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Data Mining and Diagnosing IC Fails /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Data Mining and Diagnosing IC Fails /by Leendert M. Huisman.
作者:	Huisman, Leendert M..
出版者:	Boston, MA :Springer Science+Business Media, Inc.,2005.
面頁冊數:	v.: digital
叢書名:	Frontiers in Electronic Testing, ;
標題:	Electronics
電子資源:	http://dx.doi.org/10.1007/b137446
ISBN:	9780387249933 (paper)

Data Mining and Diagnosing IC Fails /
Huisman, Leendert M..

Data Mining and Diagnosing IC Fails /[electronic resource] /by Leendert M. Huisman. - Boston, MA :Springer Science+Business Media, Inc.,2005. - v.: digital - Frontiers in Electronic Testing, ;31,0929-1296 ;.

ISBN: 9780387249933 (paper)Subjects--Topical Terms:

252955
Electronics

LC Class. No.: TK7874 / .H85 2005

Dewey Class. No.: 621.3815/48

Data Mining and Diagnosing IC Fails /
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950 $a Engineering (Springer-11647; ZDB-2-ENG)

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