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Scanning Probe Microscopy :Atomic Scale Engineering by Forces and Currents /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Scanning Probe Microscopy :by Adam Foster, Werner Hofer.
其他題名:	Atomic Scale Engineering by Forces and Currents /
作者:	Foster, Adam.
其他作者:	Hofer, Werner.
出版者:	New York, NY :Springer Science+Business Media, LLC,2006.
面頁冊數:	v.: digital
叢書名:	NanoScience and Technology,
標題:	Nanotechnology
電子資源:	http://dx.doi.org/10.1007/0-387-37231-8
ISBN:	9780387372310 (electronic bk.)

Scanning Probe Microscopy :Atomic Scale Engineering by Forces and Currents /
Foster, Adam.

Scanning Probe Microscopy :Atomic Scale Engineering by Forces and Currents /[electronic resource] :by Adam Foster, Werner Hofer. - New York, NY :Springer Science+Business Media, LLC,2006. - v.: digital - NanoScience and Technology,1434-4904.

ISBN: 9780387372310 (electronic bk.)Subjects--Topical Terms:

216697
Nanotechnology

LC Class. No.: QH212.S33 / F68 2006

Dewey Class. No.: 502.8/2

Scanning Probe Microscopy :Atomic Scale Engineering by Forces and Currents /
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