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Test and diagnosis of analogue, mixe...

Institution of Engineering and Technology.

Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Test and diagnosis of analogue, mixed-signal and RF integrated circuits :edited by Yichuang Sun.
其他題名:	the system on chip approach /
其他作者:	Sun, Yichuang.
出版者:	London :Institution of Engineering and Technology,2008.
面頁冊數:	xx, 389 p. :ill. ;24 cm.
標題:	Linear integrated circuitsTesting.
ISBN:	0863417450 (pbk.)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /
Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /edited by Yichuang Sun. - London :Institution of Engineering and Technology,2008. - xx, 389 p. :ill. ;24 cm. - Circuits, devices and systems series ;19. - IET circuits, devices and systems series ;19..

Includes bibliographical references and index.

ISBN: 0863417450 (pbk.)

Nat. Bib. No.: GBA788513bnbSubjects--Topical Terms:

306900
Linear integrated circuits
--Testing.

LC Class. No.: TK7874.654 / T626 2008

Dewey Class. No.: 621.38150287

Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /
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