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High performance memory testingdesig...

Adams, R. Dean.

High performance memory testingdesign principles, fault modeling, and self-test /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	High performance memory testingR. Dean Adams.
其他題名:	design principles, fault modeling, and self-test /
作者:	Adams, R. Dean.
出版者:	Boston :Kluwer Academic,c2003.
面頁冊數:	xiii, 246 p. :ill., digital ;25 cm.
叢書名:	Frontiers in electronic testing
Contained By:	Springer e-books
標題:	Semiconductor storage devicesTesting.
電子資源:	http://dx.doi.org/10.1007/b101876
ISBN:	9780306479724 (electronic bk.)

High performance memory testingdesign principles, fault modeling, and self-test /
Adams, R. Dean.

High performance memory testingdesign principles, fault modeling, and self-test /[electronic resource] :R. Dean Adams. - Boston :Kluwer Academic,c2003. - xiii, 246 p. :ill., digital ;25 cm. - Frontiers in electronic testing.

ISBN: 9780306479724 (electronic bk.)Subjects--Topical Terms:

345116
Semiconductor storage devices
--Testing.

LC Class. No.: TK7895.M4 / A27 2003

Dewey Class. No.: 621.39732

High performance memory testingdesign principles, fault modeling, and self-test /
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