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壓電力顯微鏡的製作與量測 = The setup and test of...

國立高雄大學應用物理學系碩士班

壓電力顯微鏡的製作與量測 = The setup and test of piezoresponse force microscope

紀錄類型:	書目-語言資料,印刷品 : 單行本
並列題名:	The setup and test of piezoresponse force microscope
作者:	黃宇寬,
其他團體作者:	國立高雄大學
出版地:	[高雄市]
出版者:	撰者;
出版年:	2009[民98]
面頁冊數:	90面圖、表 : 30公分;
標題:	壓電力顯微鏡
標題:	PFM
電子資源:	http://handle.ncl.edu.tw/11296/ndltd/67323832858062854126
附註:	參考書目：面
附註:	指導教授：余進忠
摘要註:	於量測鐵電材料的諸多科學儀器中，壓電力顯微鏡於近年已成為奈米尺度下量測鐵電性質的主要工具之一，除了微區鐵電區量測外，此一儀器亦能進行局部電滯曲線量測及局部鐵電區寫入，因此在壓電力顯微鏡的相關運用上日益受到國際間重視。於本研究中，本人運用實驗室現有的Park Systems XE-100原子力顯微鏡、鎖相放大器及高壓放大器，自行架設out-of-plane及in-plane壓電力顯微鏡，並利用PbCaTiO3 塊材來驗證並取得壓電力顯微鏡之最佳觀測參數，以便獲取高解析鐵電區影像；除此之外，亦於PbZrTiO3塊材進行驗證並觀測到典型的條紋狀鐵電區結構；在Bi0.9Pb0.1FeO3 鐵電薄膜樣品的觀測上，除進行in-plane與out-of-plane鐵電區呈像外，並進行了鐵電區的寫入以及局部電滯曲線的定量量測。 In the last decade, many researchers focus on the properties of ferroelectric materials because of their applications in the field of non-volatile memories and microelectronics. Recently, the piezoresponse force microscope has been established as a primary technique for the domain imaging and the ferroelectric characterization of ferroelectric materials under the nanometer scale. In this thesis, the out-of-plane and in-plane piezoresponse force microscope based on the XE-100 atomic force microscope, manufactured by Park Systems, is set up and tested.In order to obtain the high-resolution domain images, the influences of the measuring parameters of the piezoresponse force microscope on the domain imaging are investigated during the domain observation of the PbCaTiO3 bulk sample. In addition, the PbZrTiO3 bulk sample is also used to test the piezoresponse force microscope and the typical stripe domain of PbZrTiO3 is observed. For the Bi0.9Pb0.1FeO3 thin films, the in-plane and out-of-plane components of domain structure, the polarization switching by poling of the specified regions, and the quantitative measurements of local hysteresis are made in this home-build piezoresponse force microscope.

壓電力顯微鏡的製作與量測 = The setup and test of piezoresponse force microscope
黃, 宇寬

壓電力顯微鏡的製作與量測 = The setup and test of piezoresponse force microscope / 黃宇寬撰 - [高雄市] : 撰者, 2009[民98]. - 90面 ; 圖、表 ; 30公分.
參考書目：面指導教授：余進忠.
壓電力顯微鏡PFM

壓電力顯微鏡的製作與量測 = The setup and test of piezoresponse force microscope
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328 $a 碩士論文--國立高雄大學應用物理學系碩士班
330 $a 於量測鐵電材料的諸多科學儀器中，壓電力顯微鏡於近年已成為奈米尺度下量測鐵電性質的主要工具之一，除了微區鐵電區量測外，此一儀器亦能進行局部電滯曲線量測及局部鐵電區寫入，因此在壓電力顯微鏡的相關運用上日益受到國際間重視。於本研究中，本人運用實驗室現有的Park Systems XE-100原子力顯微鏡、鎖相放大器及高壓放大器，自行架設out-of-plane及in-plane壓電力顯微鏡，並利用PbCaTiO3 塊材來驗證並取得壓電力顯微鏡之最佳觀測參數，以便獲取高解析鐵電區影像；除此之外，亦於PbZrTiO3塊材進行驗證並觀測到典型的條紋狀鐵電區結構；在Bi0.9Pb0.1FeO3 鐵電薄膜樣品的觀測上，除進行in-plane與out-of-plane鐵電區呈像外，並進行了鐵電區的寫入以及局部電滯曲線的定量量測。 In the last decade, many researchers focus on the properties of ferroelectric materials because of their applications in the field of non-volatile memories and microelectronics. Recently, the piezoresponse force microscope has been established as a primary technique for the domain imaging and the ferroelectric characterization of ferroelectric materials under the nanometer scale. In this thesis, the out-of-plane and in-plane piezoresponse force microscope based on the XE-100 atomic force microscope, manufactured by Park Systems, is set up and tested.In order to obtain the high-resolution domain images, the influences of the measuring parameters of the piezoresponse force microscope on the domain imaging are investigated during the domain observation of the PbCaTiO3 bulk sample. In addition, the PbZrTiO3 bulk sample is also used to test the piezoresponse force microscope and the typical stripe domain of PbZrTiO3 is observed. For the Bi0.9Pb0.1FeO3 thin films, the in-plane and out-of-plane components of domain structure, the polarization switching by poling of the specified regions, and the quantitative measurements of local hysteresis are made in this home-build piezoresponse force microscope.
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