應用灰關聯分析、田口法與反應曲面法於多重品質特性最佳化製程參數設計 = ...
國立高雄大學亞太工商管理學系碩士班

 

  • 應用灰關聯分析、田口法與反應曲面法於多重品質特性最佳化製程參數設計 = Application of Grey Relational Analysis,Taguchi's Method and Response Surface Methodology in Multi-objective Quality Characterization Optimization
  • 紀錄類型: 書目-語言資料,印刷品 : 單行本
    並列題名: Application of Grey Relational Analysis,Taguchi's Method and Response Surface Methodology in Multi-objective Quality Characterization Optimization
    作者: 黃雋心,
    其他團體作者: 國立高雄大學
    出版地: [高雄市]
    出版者: 撰者;
    出版年: 2000[民89]
    面頁冊數: 66面圖、表 : 30公分;
    標題: 反應曲面法
    標題: Grey Relation Analysis
    電子資源: http://handle.ncl.edu.tw/11296/ndltd/45200631474496225699
    附註: 指導教授:盧昆宏
    附註: 參考書目:面
    摘要註: 田口品質工程的穩健設計已被廣泛應用到不同的加工生產領域裡,然而田口實驗計劃法仍是著重於單一品質特性的最佳化設計,但隨著產品的設計越來越複雜,產品品質問題已非最佳化單一品質特性就能解決,往往需要考慮到多種品質特性的同時最佳化。若使用單一品質特性方法來分別對每個品質特性最佳化,結果可能使品質特性間發生相互衝突、矛盾的現象,且品質特性數目越多其品質之相關性越強,將會帶給工程人員解決品質特性衝突上之難度。 本文以田口式實驗計劃法結合灰關聯分析來設計能同時滿足多重品質特性之最佳參數組合。若因子水準屬於連續性因子,更以反應曲面法來進一步找出最佳水準點,以確定參數組合為最佳。為了驗證此演算模式之有效性與實用性,本文分別舉液晶顯示器製程中基板雷射位移量測及光阻塗佈最適化為案例,利用本研究所提出之演算模式,分別找出該兩製程的最佳製程參數水準組合,俾驗證本演算模式的可行性,確實有效提升產品品質。 Taguchi Method’s Robust Design has been applied in a various range of industrial applications. However, the major part only aims at the question of single performance characteristics optimization. More than one quality characteristics must be simultaneously considered to effectively improve the product quality due to the increasing complexity of product design. Optimizing each quality characteristic separately may not result the optimality for the entire production. More often, considering one quality characteristic may conflict with the other. The more the number of the performance characteristics, the stronger the correlation of them. It also brings the engineer the difficulties of resolving the performance characteristics conflict. This article undertakes the Optimization of multiple quality characteristics using the combination of Taguchi Method and Grey Relational Analysis. If the factorial level belongs to the continuous factor, this work will find the best setup according to the Response Surface Methodology to confirm the valuable combination. In order to show the effectiveness and practicality of the proposed algorithm, this article uses the two cases – Substrate Laser Displacement Measurement and Optimal Coating of Photoresists of LCD process respectively. The results show that this method can find the best production process parameter level combination of the two processes. Demonstrating the effectiveness of the research, helps the company to improve the quality of product effectively.
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310001863672 博碩士論文區(二樓) 不外借資料 學位論文 TH 008M/0019 343425 4423 2009 一般使用(Normal) 在架 0
310001863680 博碩士論文區(二樓) 不外借資料 學位論文 TH 008M/0019 343425 4423 2009 c.2 一般使用(Normal) 在架 0
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