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應用負二項管制圖於高產出製程之研究 = The negative bin...

國立高雄大學亞太工商管理學系碩士班

應用負二項管制圖於高產出製程之研究 = The negative binomial control chart for high yield processes

紀錄類型:	書目-語言資料,印刷品 : 單行本
並列題名:	The negative binomial control chart for high yield processes
作者:	黃信誠,
其他團體作者:	國立高雄大學
出版地:	[高雄市]
出版者:	撰者;
出版年:	2009[民98]
面頁冊數:	54面圖、表 : 30公分;
標題:	CCC-r管制圖
標題:	Average Run Length
電子資源:	http://handle.ncl.edu.tw/11296/ndltd/38205227152254473387
附註:	指導教授：陳榮泰
附註:	參考書目：面
摘要註:	由於不合格率p管制圖是假設分配滿足逼近常態分配之前提下所建立，當製程不合格率p0很低時，會因分配無法滿足常態性假設之條件，而造成不合格率p管制圖錯誤警告增加。且因不合格率小，管制圖上易出現許多為零的點，而管制下限亦容易產生等於零之情形，無法作為判斷製程是否有顯著改善之依據。因此，不合格率p管制圖並不適合用來監控低不合格率製程，後續才發展出CCC管制圖用來取代不合格率管制圖監控高產出製程。為了進一步地提升CCC管制圖偵測製程不合格率偏移之效率，比 CCC管制圖多考慮 r 組樣本統計量之 CCC- r 管制圖因而產生。 CCC-r管制圖通常是用來監控在高產出製程中（high yield process）的不良率p（non-conforming fraction），在原始的方法中是設立一組上下管制界限，但是這通常也造成在管制中的製程（in control）形成非最高及偏態的ARL（average run length），管制中形成的非最大ARL，意味著此管制圖不能敏銳的從目標值p0偵測開始向上偏移的不良率p，另一方面在管制中形成的偏態ARL，指的是ARL1與ARL0的都是被膨脹的。在此根據一個新的方法建立CCC-r管制圖裡的近似最大與不偏的ARL，實驗的結果展示出心方法可以某些指標來說可以達到最大與不偏ARL。 The fraction non-conforming p chart approximated by normal distribution is widely used to monitor the fraction nonconforming. However, the low non-conforming fraction of process due to process improvement and small sample size usually make the assumptions invalid and generate too many false alarms. Since the non-conforming fraction is low, the lower control limit of a non-conforming fraction p chart is usually negative and no process improvement can be detected. For above mentioned reasons, the nonconforming fraction p chart is inadequate for monitoring and control of product attributes in the processes of very high yields. Cumulative count of conforming（CCC-r）charts are usually used to monitor non-conforming fraction p in high yield processes. Existing approaches to setting the control limits may cause non-maximal or biased in-control average run length（ARL）. Non-maximal in control ARL implies that the chart might not quickly detect the upward shift of p from its nominal value p0. On the other hand, biased in-control ARL means that both the in-control and out-of-control ARLs are inflated. This thesis based on a new approach to setting the control limits for CCC-r charts with near-maximal and near-unbiased in-control ARL. Experimental results show that the proposed approach is efficient in term of the maximization and unbiasedness of in-control ARL.

應用負二項管制圖於高產出製程之研究 = The negative binomial control chart for high yield processes
黃, 信誠

應用負二項管制圖於高產出製程之研究 = The negative binomial control chart for high yield processes / 黃信誠撰 - [高雄市] : 撰者, 2009[民98]. - 54面 ; 圖、表 ; 30公分.
指導教授：陳榮泰參考書目：面.
CCC-r管制圖Average Run Length

應用負二項管制圖於高產出製程之研究 = The negative binomial control chart for high yield processes
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