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Photoinduced defects in semiconductors /
~
Bube, Richard H., (1927-)
Photoinduced defects in semiconductors /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Photoinduced defects in semiconductors /David Redfield and Richard H. Bube.
作者:
Redfield, David.
其他作者:
Bube, Richard H.,
出版者:
Cambridge ;Cambridge University Press,2006.
面頁冊數:
x, 217 p. :ill. ;23 cm.
叢書名:
Cambridge studies in semiconductor physics and microelectronic engineering ;
標題:
SemiconductorsDefects.
ISBN:
0521024455 (pbk.) :
Photoinduced defects in semiconductors /
Redfield, David.
Photoinduced defects in semiconductors /
David Redfield and Richard H. Bube. - Digitally printed 1st pbk. version. - Cambridge ;Cambridge University Press,2006. - x, 217 p. :ill. ;23 cm. - Cambridge studies in semiconductor physics and microelectronic engineering ;4.
Includes bibliographical references (p. 201-214) and index.
ISBN: 0521024455 (pbk.) :NT$1436Subjects--Topical Terms:
184319
Semiconductors
--Defects.
LC Class. No.: QC611.6.D4 / R43 2006
Dewey Class. No.: 621.3815/2
Photoinduced defects in semiconductors /
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