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Architecture design for soft errors
~
Mukherjee, Shubu.
Architecture design for soft errors
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Architecture design for soft errorsShubu Mukherjee.
作者:
Mukherjee, Shubu.
出版者:
Amsterdam ;Morgan Kaufmann Publishers/Elsevier,c2008.
面頁冊數:
xxi, 337 p. :ill. ;25 cm.
標題:
Integrated circuits.
電子資源:
An electronic book accessible through the World Wide Web; click for information
電子資源:
http://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9780123695291
電子資源:
http://www.loc.gov/catdir/enhancements/fy0805/2007048527-d.html
ISBN:
9780123695291
Architecture design for soft errors
Mukherjee, Shubu.
Architecture design for soft errors
[electronic resource] /Shubu Mukherjee. - Amsterdam ;Morgan Kaufmann Publishers/Elsevier,c2008. - xxi, 337 p. :ill. ;25 cm.
Includes bibliographical references and index.
Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.
This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.
Electronic reproduction.
Amsterdam :
Elsevier Science & Technology,
2008.
Mode of access: World Wide Web.
ISBN: 9780123695291
Source: 116264:116362Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:
190434
Integrated circuits.
Index Terms--Genre/Form:
214472
Electronic books.
LC Class. No.: TK7874 / .M86143 2008eb
Dewey Class. No.: 621.3815
Architecture design for soft errors
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