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CTL for test information of digital ICs

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Kapur, Rohit.

CTL for test information of digital ICs

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	CTL for test information of digital ICsby Rohit Kapur.
作者:	Kapur, Rohit.
出版者:	Boston :Kluwer Academic Publishers,c2002.
面頁冊數:	ix, 173 p. :ill., digital ;24 cm.
Contained By:	Springer e-books
標題:	Digital integrated circuitsTesting
電子資源:	http://dx.doi.org/10.1007/b101870
ISBN:	9780306478260 (electronic bk.)

CTL for test information of digital ICs
Kapur, Rohit.

CTL for test information of digital ICs[electronic resource] /by Rohit Kapur. - Boston :Kluwer Academic Publishers,c2002. - ix, 173 p. :ill., digital ;24 cm.

ISBN: 9780306478260 (electronic bk.)Subjects--Topical Terms:

469195
Digital integrated circuits
--Testing

LC Class. No.: TK7874.65 / .K35 2002

Dewey Class. No.: 621.381548

CTL for test information of digital ICs
LDR:00706nmm 2200229 a 4500 001 265382
003 GreenPo
005 20100722152754.0
006 m d
007 cr nn 008maaau
008 101102s2002 mau s j eng d
020 $a 9780306478260 (electronic bk.)
020 $a 9781402072932 (paper)
035 $a 978-1-4020-7293-2
050 0 0 $a TK7874.65 $b .K35 2002
082 0 0 $a 621.381548 $2 21
090 $a TK7874.65 $b .K17 2002
100 1 $a Kapur, Rohit. $3 469194
245 1 0 $a CTL for test information of digital ICs $h [electronic resource] / $c by Rohit Kapur.
260 $a Boston : $b Kluwer Academic Publishers, $c c2002.
300 $a ix, 173 p. : $b ill., digital ; $c 24 cm.
650 0 $a Digital integrated circuits $x Testing $x Standards. $3 469195
650 0 $a Computer hardware description languages. $3 224543
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer e-books
856 4 0 $u http://dx.doi.org/10.1007/b101870
950 $a Engineering

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http://dx.doi.org/10.1007/b101870

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