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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsMichael L. Bushnell, Vishwani D. Agrawal.
作者:	Bushnell, Michael L.
其他作者:	Agrawal, Vishwani D.
出版者:	Boston :Kluwer Academic,c2002.
面頁冊數:	xviii, 690 p. :ill., digital ;26 cm.
叢書名:	Frontiers in electronic testing ;
Contained By:	Springer e-books
標題:	Integrated circuitsVery large scale integration
電子資源:	http://dx.doi.org/10.1007/b117406
ISBN:	9780306470400 (electronic bk.)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Bushnell, Michael L.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits[electronic resource] /Michael L. Bushnell, Vishwani D. Agrawal. - Boston :Kluwer Academic,c2002. - xviii, 690 p. :ill., digital ;26 cm. - Frontiers in electronic testing ;17.

ISBN: 9780306470400 (electronic bk.)Subjects--Topical Terms:

182401
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / .B87 2002

Dewey Class. No.: 621.395

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
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