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Nanometer technology designshigh-qua...
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Ahmed, Nisar.
Nanometer technology designshigh-quality delay tests /
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Nanometer technology designsby Mohammad Tehranipoor, Nisar Ahmed.
其他題名:
high-quality delay tests /
作者:
Tehranipoor, Mohammad.
其他作者:
Ahmed, Nisar.
出版者:
Boston, MA :Springer US,2008.
面頁冊數:
xvii, 281 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Nanoelectronics.
電子資源:
http://dx.doi.org/10.1007/978-0-387-75728-5
ISBN:
9780387757285 (electronic bk.)
Nanometer technology designshigh-quality delay tests /
Tehranipoor, Mohammad.
Nanometer technology designs
high-quality delay tests /[electronic resource] :by Mohammad Tehranipoor, Nisar Ahmed. - Boston, MA :Springer US,2008. - xvii, 281 p. :ill., digital ;24 cm.
ISBN: 9780387757285 (electronic bk.)Subjects--Topical Terms:
308072
Nanoelectronics.
Dewey Class. No.: 621.381548
Nanometer technology designshigh-quality delay tests /
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