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Advanced test methods for SRAMseffec...

Bosio, Alberto.

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Advanced test methods for SRAMsby Alberto Bosio ... [et al.].
其他題名:	effective solutions for dynamic fault detection in nanoscaled technologies /
其他作者:	Bosio, Alberto.
出版者:	Boston, MA :Springer-Verlag US,2010.
面頁冊數:	xv, 171 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Random access memoryTesting.
電子資源:	http://dx.doi.org/10.1007/978-1-4419-0938-1
ISBN:	9781441909381 (electronic bk.)

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /
Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /[electronic resource] :by Alberto Bosio ... [et al.]. - Boston, MA :Springer-Verlag US,2010. - xv, 171 p. :ill., digital ;24 cm.

ISBN: 9781441909381 (electronic bk.)Subjects--Topical Terms:

185576
Random access memory
--Testing.

LC Class. No.: TK7895.M4 / A3185 2010

Dewey Class. No.: 621.3973

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /
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