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Atomic scale characterization and fi...

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Atomic scale characterization and first-principles studies of Si3N4 interfaces

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Atomic scale characterization and first-principles studies of Si3N4 interfacesby Weronika Walkosz.
作者:	Walkosz, Weronika.
出版者:	New York, NY :Springer Science+Business Media, LLC,2011.
面頁冊數:	xiii, 108 p. :ill., digital ;24 cm.
叢書名:	Springer theses
Contained By:	Springer eBooks
標題:	Interfaces (Physical sciences)
電子資源:	http://dx.doi.org/10.1007/978-1-4419-7817-2
ISBN:	9781441978172 (electronic bk.)

Atomic scale characterization and first-principles studies of Si3N4 interfaces
Walkosz, Weronika.

Atomic scale characterization and first-principles studies of Si3N4 interfaces[electronic resource] /by Weronika Walkosz. - New York, NY :Springer Science+Business Media, LLC,2011. - xiii, 108 p. :ill., digital ;24 cm. - Springer theses.

ISBN: 9781441978172 (electronic bk.)Subjects--Topical Terms:

190461
Interfaces (Physical sciences)

LC Class. No.: QC173.4.I57 / W35 2011

Dewey Class. No.: 541.33

Atomic scale characterization and first-principles studies of Si3N4 interfaces
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