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Modern approaches in applied intelli...

(1998 :)

Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Modern approaches in applied intelligenceedited by Kishan G. Mehrotra ... [et al.].
其他題名:	24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.
其他題名:	IEA/AIE 2011
其他作者:	Mehrotra, Kishan G.
團體作者:
出版者:	Berlin, Heidelberg :Springer-Verlag GmbH Berlin Heidelberg,2011.
面頁冊數:	xx, 581 p. :ill., digital ;24 cm.
叢書名:	Lecture notes in computer science,
Contained By:	Springer eBooks
標題:	Artificial intelligenceCongresses.Industrial applications
電子資源:	http://dx.doi.org/10.1007/978-3-642-21827-9
ISBN:	9783642218279 (electronic bk.)

Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /
Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /[electronic resource] :IEA/AIE 2011edited by Kishan G. Mehrotra ... [et al.]. - Berlin, Heidelberg :Springer-Verlag GmbH Berlin Heidelberg,2011. - xx, 581 p. :ill., digital ;24 cm. - Lecture notes in computer science,67040302-9743 ;.

ISBN: 9783642218279 (electronic bk.)Subjects--Topical Terms:

439227
Artificial intelligence
--Industrial applications--Congresses.

LC Class. No.: Q334 / .I58 2011

Dewey Class. No.: 006.3

Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /
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