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Built-in-self-test and digital self-...

Bou-Sleiman, Sleiman.

Built-in-self-test and digital self-calibration for RF SoCs

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Built-in-self-test and digital self-calibration for RF SoCsby Sleiman Bou-Sleiman, Mohammed Ismail.
作者:	Bou-Sleiman, Sleiman.
其他作者:	Ismail, Mohammed.
出版者:	New York, NY :Springer Science+Business Media, LLC,2012.
面頁冊數:	xvii, 89 p. :digital ;24 cm.
Contained By:	Springer eBooks
標題:	Circuits and Systems.
電子資源:	http://dx.doi.org/10.1007/978-1-4419-9548-3
ISBN:	9781441995483 (electronic bk.)

Built-in-self-test and digital self-calibration for RF SoCs
Bou-Sleiman, Sleiman.

Built-in-self-test and digital self-calibration for RF SoCs[electronic resource] /by Sleiman Bou-Sleiman, Mohammed Ismail. - New York, NY :Springer Science+Business Media, LLC,2012. - xvii, 89 p. :digital ;24 cm. - SpringerBriefs in electrical and computer engineering. - SpringerBriefs in electrical and computer engineering..

ISBN: 9781441995483 (electronic bk.)Subjects--Topical Terms:

274416
Circuits and Systems.

LC Class. No.: TK6561 / .B68 2012

Dewey Class. No.: 621.38412

Built-in-self-test and digital self-calibration for RF SoCs
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