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Life-cycle assessment of semiconductors
~
Boyd, Sarah B.
Life-cycle assessment of semiconductors
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Life-cycle assessment of semiconductorsby Sarah B. Boyd.
作者:
Boyd, Sarah B.
出版者:
New York, NY :Springer Science+Business Media, LLC,2012.
面頁冊數:
xxvii, 226 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Product life cycle.
電子資源:
http://dx.doi.org/10.1007/978-1-4419-9988-7
ISBN:
9781441999887 (electronic bk.)
Life-cycle assessment of semiconductors
Boyd, Sarah B.
Life-cycle assessment of semiconductors
[electronic resource] /by Sarah B. Boyd. - New York, NY :Springer Science+Business Media, LLC,2012. - xxvii, 226 p. :ill., digital ;24 cm.
ISBN: 9781441999887 (electronic bk.)Subjects--Topical Terms:
197255
Product life cycle.
LC Class. No.: TK7871.85 / .B69 2012
Dewey Class. No.: 621.38152
Life-cycle assessment of semiconductors
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