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具細長探針的微懸臂梁力學分析 = Mechanical analysis...

國立高雄大學土木與環境工程學系碩士班

具細長探針的微懸臂梁力學分析 = Mechanical analysis of microcantilevers with tube probes

Record Type:	Language materials, printed : monographic
Paralel Title:	Mechanical analysis of microcantilevers with tube probes
Author:	蔡尚豪,
Secondary Intellectual Responsibility:	國立高雄大學
Place of Publication:	[高雄市]
Published:	撰者;
Year of Publication:	2014[民103]
Description:	98面部份彩圖，表 : 30公分;
Subject:	振動
Subject:	Buckling
Online resource:	http://handle.ncl.edu.tw/11296/ndltd/21853568415595067981
Notes:	參考書目：面86-88
Notes:	103年12月16日公開
Summary:	本論文研究具奈米碳管探針之微懸臂梁在原子力顯微鏡(AFM)中的力學分析，以了解微觀結構物的力學行為。主要內容可分為靜態與動態兩大部分。靜態部分，本研究首先對奈米碳管的挫屈進行分析，並發展一套能計算奈米碳管挫屈應力的方法以防止奈米碳管挫屈造成的掃描誤差。結果顯示本研究之分析方法確能用以計算奈米碳管的挫屈應力。此外利用細長材料的受壓實驗以模擬奈米碳管的受壓變形關係，並利用實驗之側向變形反推材料之慣性矩，以期發展利用奈米碳管受壓變形計算奈米碳管慣性矩之方法。結果顯示，利用細長材料的受壓側向變形確能用以評估材料之慣性矩。動態部分，本研究利用特徵值分析方法分析動態原子力顯微鏡下具奈米碳管探針之微懸臂梁系統之動態力學模型，並以分析結果探討在不同初始傾角下探針的穩定性。結果顯示，在碳管與樣品表面夾角愈小時，整體系統的穩定性相對提高。因此在動態原子力顯微鏡輕敲模式下，避免奈米碳管與樣品表面垂直能有效降低系統產生的不穩定現象。 In this thesis, a mechanical analysis of micro-cantilever beam with carbon nanotube (CNT) probes in atomic force microscopy (AFM) is carried out to provide insights into the mechanical behavior of microscopic structures. The main contents are divided into two parts, static and dynamic. In the static part, we analyze the buckling of CNTs, developing a method for the evaluation of CNT buckling stress to prevent scanning errors caused by the buckling of CNTs. The results show that the analysis of the current study is capable of predicting the CNT buckling stress. In addition, we use a slender material compression experiment to simulate the relationship between compression and deformation of CNTs with the lateral deformation of slender materials being performed to calculate the moment of inertia of the slender material. The results show that the lateral deformation under pressure of thin materials can be used to assess the moment of inertia of the slender materials. In the dynamic part, we use eigenvalue analysis methods to analyze the dynamic AFM microcantilever beam with a CNT probe, enabling us to understand the dynamic mechanical model of the system. The results of the analysis is used to explore the stability under different initial inclination of the probe. The results show that the smaller the angle between the tube and the sample surface, the more the stability of the overall system is increased. Therefore, in the tapping mode atomic force microscope, the instability generated by the system is reduced if the carbon nanotube is not perpendicular to the sample surface.

具細長探針的微懸臂梁力學分析 = Mechanical analysis of microcantilevers with tube probes
蔡, 尚豪

具細長探針的微懸臂梁力學分析 = Mechanical analysis of microcantilevers with tube probes / 蔡尚豪撰 - [高雄市] : 撰者, 2014[民103]. - 98面 ; 部份彩圖，表 ; 30公分.
參考書目：面86-88103年12月16日公開.
振動Buckling

具細長探針的微懸臂梁力學分析 = Mechanical analysis of microcantilevers with tube probes
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314 $a 指導教授：施博仁博士
328 $a 碩士論文--國立高雄大學土木與環境工程學系碩士班
330 $a 本論文研究具奈米碳管探針之微懸臂梁在原子力顯微鏡(AFM)中的力學分析，以了解微觀結構物的力學行為。主要內容可分為靜態與動態兩大部分。靜態部分，本研究首先對奈米碳管的挫屈進行分析，並發展一套能計算奈米碳管挫屈應力的方法以防止奈米碳管挫屈造成的掃描誤差。結果顯示本研究之分析方法確能用以計算奈米碳管的挫屈應力。此外利用細長材料的受壓實驗以模擬奈米碳管的受壓變形關係，並利用實驗之側向變形反推材料之慣性矩，以期發展利用奈米碳管受壓變形計算奈米碳管慣性矩之方法。結果顯示，利用細長材料的受壓側向變形確能用以評估材料之慣性矩。動態部分，本研究利用特徵值分析方法分析動態原子力顯微鏡下具奈米碳管探針之微懸臂梁系統之動態力學模型，並以分析結果探討在不同初始傾角下探針的穩定性。結果顯示，在碳管與樣品表面夾角愈小時，整體系統的穩定性相對提高。因此在動態原子力顯微鏡輕敲模式下，避免奈米碳管與樣品表面垂直能有效降低系統產生的不穩定現象。 In this thesis, a mechanical analysis of micro-cantilever beam with carbon nanotube (CNT) probes in atomic force microscopy (AFM) is carried out to provide insights into the mechanical behavior of microscopic structures. The main contents are divided into two parts, static and dynamic. In the static part, we analyze the buckling of CNTs, developing a method for the evaluation of CNT buckling stress to prevent scanning errors caused by the buckling of CNTs. The results show that the analysis of the current study is capable of predicting the CNT buckling stress. In addition, we use a slender material compression experiment to simulate the relationship between compression and deformation of CNTs with the lateral deformation of slender materials being performed to calculate the moment of inertia of the slender material. The results show that the lateral deformation under pressure of thin materials can be used to assess the moment of inertia of the slender materials. In the dynamic part, we use eigenvalue analysis methods to analyze the dynamic AFM microcantilever beam with a CNT probe, enabling us to understand the dynamic mechanical model of the system. The results of the analysis is used to explore the stability under different initial inclination of the probe. The results show that the smaller the angle between the tube and the sample surface, the more the stability of the overall system is increased. Therefore, in the tapping mode atomic force microscope, the instability generated by the system is reduced if the carbon nanotube is not perpendicular to the sample surface.
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610 1 $a Buckling $a Vibration $a Carbon Nanotube (CNT) $a Atomic Force Microscopy (AFM)
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