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黏滯流環境下掃描探針與試體之互制探討 = Tip and Specime...

國立高雄大學土木與環境工程學系碩士班

黏滯流環境下掃描探針與試體之互制探討 = Tip and Specimen Interaction of Scanning Probe Microscope in Viscous Fluid Environment

紀錄類型:	書目-語言資料,印刷品 : 單行本
並列題名:	Tip and Specimen Interaction of Scanning Probe Microscope in Viscous Fluid Environment
作者:	施華儒,
其他團體作者:	國立高雄大學
出版地:	[高雄市]
出版者:	撰者;
出版年:	2015[民104]
面頁冊數:	84葉圖，表格 : 30公分;
標題:	原子力顯微鏡
標題:	atomic force microscope
電子資源:	http://hdl.handle.net/11296/ndltd/79326653039042629390
附註:	106年10月31日公開
附註:	參考書目：葉64-66
附註:	含附錄
摘要註:	於液體環境中操作的原子力顯微鏡廣泛使用在掃描生物試體的表面輪廓。但接觸模式因探針直接貼著試體，容易使柔軟的生物試體損壞; 而敲觸模式是觸發微懸臂梁的特徵頻率導致探針週期性地敲擊試體，故敲觸式較為理想。但微懸臂梁在液體中振動會引致額外的水壓導致特徵頻率的飄移。鮮少研究著重於試體表面上，來自於探針針尖引致的流體動水壓，而這微小的壓力足以使試體變形，影響掃描結果。本研究將透過一套半解析方法，分析不同幾何形狀的針尖，其壓力分佈。根據結果，錐形針尖會對試體產生最大的流體動力水壓(約為 0.5Pa)，意即探針尚未接觸到試體時試體便會因水壓而造成數奈米的變形。此外，增加針尖後對試體造成的水壓為微懸臂梁時的20倍。當半圓試體參與流固作用時，半圓試體壓力分佈由試體頂端向二側遞增，而試體左右兩側壓力大小又與探針的相對位置有關。這些結果尚未被其他論文討論。 A procedure is Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at resonance frequencies, and so the tip periodically knocks the specimen. It is well known that the cantilever induces extra liquid pressure that leads to drift in the resonance frequency. However, few studies have focused on the hydrodynamic pressure on the specimen. The pressure generated from the tip itself pushes the specimen, causing deformation. In this paper, we introduce a semi- analytical method to analyze the pressure distribution of various tip geometries. According to our analysis, the maximum hydrodynamic pressure on the specimen caused by a cone- shaped tip is ~0.5 Pa, which can, for example, pre-deform a cell by several nanometers in compression before the tip taps it. Moreover, the pressure calculated on the surface of the specimen is twenty times larger than the pressure without considering the tip effect. When consider the contribution of semicircle specimen, the pressure increase along the surface from the top of specimen to siders. And the relative position of specimen and probe influence the pressure ration with the left and ring of specimen. These results have not been motioned in other papers.

黏滯流環境下掃描探針與試體之互制探討 = Tip and Specimen Interaction of Scanning Probe Microscope in Viscous Fluid Environment
施, 華儒

黏滯流環境下掃描探針與試體之互制探討 = Tip and Specimen Interaction of Scanning Probe Microscope in Viscous Fluid Environment / 施華儒撰 - [高雄市] : 撰者, 2015[民104]. - 84葉 ; 圖，表格 ; 30公分.
106年10月31日公開參考書目：葉64-66含附錄.
原子力顯微鏡atomic force microscope

黏滯流環境下掃描探針與試體之互制探討 = Tip and Specimen Interaction of Scanning Probe Microscope in Viscous Fluid Environment
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