國立高雄大學圖資館 |

語系: 繁體中文

說明(常見問題)

圖資館首頁

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Wafer-level chip-scale packaginganal...

Liu, Yong.

Wafer-level chip-scale packaginganalog and power semiconductor applications /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Wafer-level chip-scale packagingby Shichun Qu, Yong Liu.
其他題名:	analog and power semiconductor applications /
作者:	Qu, Shichun.
其他作者:	Liu, Yong.
出版者:	New York, NY :Springer New York :2015.
面頁冊數:	xvii, 322 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Chip scale packaging.
電子資源:	http://dx.doi.org/10.1007/978-1-4939-1556-9
ISBN:	9781493915569 (electronic bk.)

Wafer-level chip-scale packaginganalog and power semiconductor applications /
Qu, Shichun.

Wafer-level chip-scale packaginganalog and power semiconductor applications /[electronic resource] :by Shichun Qu, Yong Liu. - New York, NY :Springer New York :2015. - xvii, 322 p. :ill., digital ;24 cm.

Chapter 1. Demand and Challenges for Wafer Level Analog and Power Packaging -- Chapter 2. Fan-In Analog Wafer Level Chip Scale Package -- Chapter 3. Fan-Out Analog Wafer Level Chip Scale Package -- Chapter 4. Wafer Level Analog Chip Scale Package Stackable Design -- Chapter 5. Wafer Level Discrete Power MOSFET Package Design -- Chapter 6. Wafer Level Packaging TSV/Stack die for Integration of Analog and Power Solution -- Chapter 7. Thermal Management, Design, Analysis for WLCSP -- Chapter 8. Electrical and Multi-Physics Simulations for Analog and Power WLCSP -- Chapter 9. WLCSP Typical Assembly Process -- Chapter 10. WLCSP Typical Reliability and Test.

This book presents a state-of-art and in-depth overview in analog and power WLCSP design, material characterization, reliability, and modeling. Recent advances in analog and power electronic WLCSP packaging are presented based on the development of analog technology and power device integration. The book covers in detail how advances in semiconductor content, analog and power advanced WLCSP design, assembly, materials, and reliability have co-enabled significant advances in fan-in and fan-out with redistributed layer (RDL) of analog and power device capability during recent years. Along with new analog and power WLCSP development, the role of modeling is a key to assure successful package design. An overview of the analog and power WLCSP modeling and typical thermal, electrical, and stress modeling methodologies is also provided. This book also: Covers the development of wafer-level power discrete packaging with regular wafer-level design concepts and directly bumping technology Introduces the development of the analog and power SIP/3D/TSV/stack die packaging technology Presents the wafer-level analog IC packaging design through fan-in and fan-out with RDLs

ISBN: 9781493915569 (electronic bk.)

Standard No.: 10.1007/978-1-4939-1556-9doiSubjects--Topical Terms:

710736
Chip scale packaging.

LC Class. No.: TK7870.17

Dewey Class. No.: 621

Wafer-level chip-scale packaginganalog and power semiconductor applications /
LDR:02827nmm a2200325 a 4500 001 459769
003 DE-He213
005 20150602153329.0
006 m d
007 cr nn 008maaau
008 151110s2015 nyu s 0 eng d
020 $a 9781493915569 (electronic bk.)
020 $a 9781493915552 (paper)
024 7 $a 10.1007/978-1-4939-1556-9 $2 doi
035 $a 978-1-4939-1556-9
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7870.17
072 7 $a TJF $2 bicssc
072 7 $a TEC008000 $2 bisacsh
072 7 $a TEC008070 $2 bisacsh
082 0 4 $a 621 $2 23
090 $a TK7870.17 $b .Q1 2015
100 1 $a Qu, Shichun. $3 710735
245 1 0 $a Wafer-level chip-scale packaging $h [electronic resource] : $b analog and power semiconductor applications / $c by Shichun Qu, Yong Liu.
260 $a New York, NY : $b Springer New York : $b Imprint: Springer, $c 2015.
300 $a xvii, 322 p. : $b ill., digital ; $c 24 cm.
505 0 $a Chapter 1. Demand and Challenges for Wafer Level Analog and Power Packaging -- Chapter 2. Fan-In Analog Wafer Level Chip Scale Package -- Chapter 3. Fan-Out Analog Wafer Level Chip Scale Package -- Chapter 4. Wafer Level Analog Chip Scale Package Stackable Design -- Chapter 5. Wafer Level Discrete Power MOSFET Package Design -- Chapter 6. Wafer Level Packaging TSV/Stack die for Integration of Analog and Power Solution -- Chapter 7. Thermal Management, Design, Analysis for WLCSP -- Chapter 8. Electrical and Multi-Physics Simulations for Analog and Power WLCSP -- Chapter 9. WLCSP Typical Assembly Process -- Chapter 10. WLCSP Typical Reliability and Test.
520 $a This book presents a state-of-art and in-depth overview in analog and power WLCSP design, material characterization, reliability, and modeling. Recent advances in analog and power electronic WLCSP packaging are presented based on the development of analog technology and power device integration. The book covers in detail how advances in semiconductor content, analog and power advanced WLCSP design, assembly, materials, and reliability have co-enabled significant advances in fan-in and fan-out with redistributed layer (RDL) of analog and power device capability during recent years. Along with new analog and power WLCSP development, the role of modeling is a key to assure successful package design. An overview of the analog and power WLCSP modeling and typical thermal, electrical, and stress modeling methodologies is also provided. This book also: Covers the development of wafer-level power discrete packaging with regular wafer-level design concepts and directly bumping technology Introduces the development of the analog and power SIP/3D/TSV/stack die packaging technology Presents the wafer-level analog IC packaging design through fan-in and fan-out with RDLs
650 0 $a Chip scale packaging. $3 710736
650 1 4 $a Engineering. $3 210888
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 274412
650 2 4 $a Circuits and Systems. $3 274416
650 2 4 $a Engineering Thermodynamics, Heat and Mass Transfer. $3 338996
700 1 $a Liu, Yong. $3 259965
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4939-1556-9
950 $a Engineering (Springer-11647)