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X-ray line profile analysis in mater...

Gubicza, Jeno, (1969-)

X-ray line profile analysis in materials science /

Record Type:	Electronic resources : Monograph/item
Title/Author:	X-ray line profile analysis in materials science /Jeno Gubicza.
Author:	Gubicza, Jeno,
Description:	PDFs (343 pages)
Subject:	X-ray crystallography.
Online resource:	http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-5852-3
ISBN:	9781466658530$q(electronic)

X-ray line profile analysis in materials science /
Gubicza, Jeno,1969-

X-ray line profile analysis in materials science /Jeno Gubicza. - PDFs (343 pages)

Includes bibliographical references and index.

Fundamentals of kinematical X-ray scattering theory -- Crystallite size broadening of diffraction line profiles -- Strain broadening of X-ray diffraction peaks -- Line profiles caused by planar faults -- Influence of chemical heterogeneities on line profiles -- Evaluation methods of line profiles -- Peak profile evaluation for thin films -- X-ray line profile analysis for single crystals -- Practical applications of X-ray line profile analysis.

Restricted to subscribers or individual electronic text purchasers.

"X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis"--Provided by publisher.

Mode of access: World Wide Web.

ISBN: 9781466658530$q(electronic)

Standard No.: 10.4018/978-1-4666-5852-3doiSubjects--Topical Terms:

194759
X-ray crystallography.
Subjects--Index Terms:

Applications of X-ray line profile analysis

LC Class. No.: QD945 / .G83 2014e

Dewey Class. No.: 548.83

X-ray line profile analysis in materials science /
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100 1 $a Gubicza, Jeno, $d 1969- $e author. $3 717922
245 1 0 $a X-ray line profile analysis in materials science / $c Jeno Gubicza.
264 1 $a Hershey, Pennsylvania (701 E. Chocolate Avenue, Hershey, PA 17033, USA) : $b IGI Global, $c [2014]
300 $a PDFs (343 pages)
336 $a text $2 rdacontent
337 $a electronic $2 isbdmedia
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504 $a Includes bibliographical references and index.
505 0 $a Fundamentals of kinematical X-ray scattering theory -- Crystallite size broadening of diffraction line profiles -- Strain broadening of X-ray diffraction peaks -- Line profiles caused by planar faults -- Influence of chemical heterogeneities on line profiles -- Evaluation methods of line profiles -- Peak profile evaluation for thin films -- X-ray line profile analysis for single crystals -- Practical applications of X-ray line profile analysis.
506 $a Restricted to subscribers or individual electronic text purchasers.
520 3 $a "X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis"--Provided by publisher.
530 $a Also available in print.
538 $a Mode of access: World Wide Web.
650 0 $a X-ray crystallography. $3 194759
653 $a Applications of X-ray line profile analysis
653 $a Crystallite size broadening of diffraction line profiles
653 $a Evaluation methods of line profiles
653 $a Influence of chemical heterogeneities
653 $a Kinematical X-ray scattering theory
653 $a Line profiles caused by planar faults
653 $a Peak profile evaluation for thin films
653 $a Strain broadening of X-ray diffractional peaks
653 $a X-ray line profile analysis for single crystals
710 2 $a IGI Global, $e publisher. $3 717658
776 0 8 $i Print version: $z 1466658525 $z 9781466658523
856 4 1 $3 Chapter PDFs via platform: $u http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-5852-3