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Risk assessment and risk-driven test...

(1998 :)

Risk assessment and risk-driven testingthird International Workshop, RISK 2015, Berlin, Germany, June 15, 2015 : revised selected papers /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Risk assessment and risk-driven testingedited by Fredrik Seehusen ... [et al.].
其他題名:	third International Workshop, RISK 2015, Berlin, Germany, June 15, 2015 : revised selected papers /
其他題名:	RISK 2015
其他作者:	Seehusen, Fredrik.
團體作者:
出版者:	Cham :Springer International Publishing :2015.
面頁冊數:	ix, 121 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Computer science.
電子資源:	http://dx.doi.org/10.1007/978-3-319-26416-5
ISBN:	9783319264165$q(electronic bk.)

Risk assessment and risk-driven testingthird International Workshop, RISK 2015, Berlin, Germany, June 15, 2015 : revised selected papers /
Risk assessment and risk-driven testingthird International Workshop, RISK 2015, Berlin, Germany, June 15, 2015 : revised selected papers /[electronic resource] :RISK 2015edited by Fredrik Seehusen ... [et al.]. - Cham :Springer International Publishing :2015. - ix, 121 p. :ill., digital ;24 cm. - Lecture notes in computer science,94880302-9743 ;. - Lecture notes in computer science ;4891..

This book constitutes the thoroughly refereed conference proceedings of the Third International Workshop on Risk Assessment and Risk-driven Testing, RISK 2015, held in conjunction with the OMG Technical Meeting in Berlin, Germany, in June 2015. The revised 8 full papers were carefully reviewed and selected from 12 submissions. This workshop addresses systematic approaches that combine risk assessment and testing. Also, the workshop was structured into the three sessions namely Risk Assessment, Risk and Development and Security Testing.

ISBN: 9783319264165$q(electronic bk.)

Standard No.: 10.1007/978-3-319-26416-5doiSubjects--Topical Terms:

199325
Computer science.

LC Class. No.: QA76.758

Dewey Class. No.: 005.1

Risk assessment and risk-driven testingthird International Workshop, RISK 2015, Berlin, Germany, June 15, 2015 : revised selected papers /
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