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Outlook and challenges of nano devic...

Li, Ting.

Outlook and challenges of nano devices, sensors, and MEMS

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Outlook and challenges of nano devices, sensors, and MEMSedited by Ting Li, Ziv Liu.
其他作者:	Li, Ting.
出版者:	Cham :Springer International Publishing :2017.
面頁冊數:	xvi, 521 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Nanotechnology.
電子資源:	http://dx.doi.org/10.1007/978-3-319-50824-5
ISBN:	9783319508245$q(electronic bk.)

Outlook and challenges of nano devices, sensors, and MEMS
Outlook and challenges of nano devices, sensors, and MEMS[electronic resource] /edited by Ting Li, Ziv Liu. - Cham :Springer International Publishing :2017. - xvi, 521 p. :ill. (some col.), digital ;24 cm.

Introduction -- High-k dielectric for nanoscale MOS devices -- Performance, optimization, and reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect transistors -- Graphene technology for future MEMS and sensor applications -- Nanoscale sensors for next-generation optical transceiver applications -- Nanoscale MEMS for future optical communication applications -- Nanoscale devices for biomedical applications -- Effect of nanoscale structure on reliability of nano devices and sensors -- Compact modeling of nano devices and sensors -- Three-dimensional TCAD simulation of nano semiconductor devices -- Fabrication of nano devices based on novel material -- Novel processing technology for fabricating nano devices and sensors -- Conclusions.

This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.

ISBN: 9783319508245$q(electronic bk.)

Standard No.: 10.1007/978-3-319-50824-5doiSubjects--Topical Terms:

193873
Nanotechnology.

LC Class. No.: T174.7

Dewey Class. No.: 620.5

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505 0 $a Introduction -- High-k dielectric for nanoscale MOS devices -- Performance, optimization, and reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect transistors -- Graphene technology for future MEMS and sensor applications -- Nanoscale sensors for next-generation optical transceiver applications -- Nanoscale MEMS for future optical communication applications -- Nanoscale devices for biomedical applications -- Effect of nanoscale structure on reliability of nano devices and sensors -- Compact modeling of nano devices and sensors -- Three-dimensional TCAD simulation of nano semiconductor devices -- Fabrication of nano devices based on novel material -- Novel processing technology for fabricating nano devices and sensors -- Conclusions.
520 $a This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.
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