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EM material characterization techniq...
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Nair, Raveendranath U.
EM material characterization techniques for metamaterials
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
EM material characterization techniques for metamaterialsby Raveendranath U. Nair ... [et al.].
其他作者:
Nair, Raveendranath U.
出版者:
Singapore :Springer Singapore :2018.
面頁冊數:
xxiii, 50 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Metamaterials.
電子資源:
http://dx.doi.org/10.1007/978-981-10-6517-0
ISBN:
9789811065170$q(electronic bk.)
EM material characterization techniques for metamaterials
EM material characterization techniques for metamaterials
[electronic resource] /by Raveendranath U. Nair ... [et al.]. - Singapore :Springer Singapore :2018. - xxiii, 50 p. :ill., digital ;24 cm. - SpringerBriefs in electrical and computer engineering,2191-8112. - SpringerBriefs in electrical and computer engineering..
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials.
ISBN: 9789811065170$q(electronic bk.)
Standard No.: 10.1007/978-981-10-6517-0doiSubjects--Topical Terms:
246129
Metamaterials.
LC Class. No.: TK7871.15.M48 / E5 2018
Dewey Class. No.: 620.11
EM material characterization techniques for metamaterials
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This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials.
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