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Scanning electron microscopy and x-r...

Goldstein, Joseph I.

Scanning electron microscopy and x-ray microanalysis

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Scanning electron microscopy and x-ray microanalysisby Joseph I. Goldstein ... [et al.].
其他作者:	Goldstein, Joseph I.
出版者:	New York, NY :Springer New York :2018.
面頁冊數:	xxiii, 550 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Scanning electron microscopy.
電子資源:	http://dx.doi.org/10.1007/978-1-4939-6676-9
ISBN:	9781493966769$q(electronic bk.)

Scanning electron microscopy and x-ray microanalysis
Scanning electron microscopy and x-ray microanalysis[electronic resource] /by Joseph I. Goldstein ... [et al.]. - 4th ed. - New York, NY :Springer New York :2018. - xxiii, 550 p. :ill. (some col.), digital ;24 cm.

Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.

ISBN: 9781493966769$q(electronic bk.)

Standard No.: 10.1007/978-1-4939-6676-9doiSubjects--Topical Terms:

242518
Scanning electron microscopy.

LC Class. No.: QH212.S3

Dewey Class. No.: 502.825

Scanning electron microscopy and x-ray microanalysis
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