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Semiconductor power devicesphysics, ...
~
Lutz, Josef.
Semiconductor power devicesphysics, characteristics, reliability /
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Semiconductor power devicesby Josef Lutz ... [et al.].
其他題名:
physics, characteristics, reliability /
其他作者:
Lutz, Josef.
出版者:
Cham :Springer International Publishing :2018.
面頁冊數:
xix, 714 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Power semiconductors.
電子資源:
http://dx.doi.org/10.1007/978-3-319-70917-8
ISBN:
9783319709178$q(electronic bk.)
Semiconductor power devicesphysics, characteristics, reliability /
Semiconductor power devices
physics, characteristics, reliability /[electronic resource] :by Josef Lutz ... [et al.]. - 2nd ed. - Cham :Springer International Publishing :2018. - xix, 714 p. :ill., digital ;24 cm.
Power Semiconductor Devices - Key Components for Efficient Electrical Energy Conversion Systems -- Semiconductor Properties -- pn-Junctions -- Short Introduction to Power Device Technology -- pin-Diodes -- Schottky Diodes -- Bipolar Transistors -- Thyristors -- MOS Transistors -- IGBTs -- Packaging and Reliability of Power Devices -- Destructive Mechanisms in Power Devices -- Power Device-Induced Oscillations and Electromagnetic Disturbances -- Power Electronic System Integration.
This book discusses semiconductor properties, pn-junctions and the physical phenomena for understanding power devices in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. Special peculiarities of devices from the ascending semiconductor materials SiC and GaN are discussed. This book presents significant improvements compared to its first edition. It includes chapters on packaging and reliability. The chapter on semiconductor technology is written in a more in-depth way by considering 2D- and high concentration effects. The chapter on IGBTs is extended by new technologies and evaluation of its potential. An extended theory of cosmic ray failures is presented. The range of certain important physical relationships, doubted in recent papers for use in device simulation, is cleared and substantiated in this second edition.
ISBN: 9783319709178$q(electronic bk.)
Standard No.: 10.1007/978-3-319-70917-8doiSubjects--Topical Terms:
197819
Power semiconductors.
LC Class. No.: TK7871.85
Dewey Class. No.: 621.38152
Semiconductor power devicesphysics, characteristics, reliability /
LDR
:02424nmm a2200325 a 4500
001
531816
003
DE-He213
005
20180216162045.0
006
m d
007
cr nn 008maaau
008
181113s2018 gw s 0 eng d
020
$a
9783319709178$q(electronic bk.)
020
$a
9783319709161$q(paper)
024
7
$a
10.1007/978-3-319-70917-8
$2
doi
035
$a
978-3-319-70917-8
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7871.85
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
082
0 4
$a
621.38152
$2
23
090
$a
TK7871.85
$b
.S471 2018
245
0 0
$a
Semiconductor power devices
$h
[electronic resource] :
$b
physics, characteristics, reliability /
$c
by Josef Lutz ... [et al.].
250
$a
2nd ed.
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2018.
300
$a
xix, 714 p. :
$b
ill., digital ;
$c
24 cm.
505
0
$a
Power Semiconductor Devices - Key Components for Efficient Electrical Energy Conversion Systems -- Semiconductor Properties -- pn-Junctions -- Short Introduction to Power Device Technology -- pin-Diodes -- Schottky Diodes -- Bipolar Transistors -- Thyristors -- MOS Transistors -- IGBTs -- Packaging and Reliability of Power Devices -- Destructive Mechanisms in Power Devices -- Power Device-Induced Oscillations and Electromagnetic Disturbances -- Power Electronic System Integration.
520
$a
This book discusses semiconductor properties, pn-junctions and the physical phenomena for understanding power devices in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. Special peculiarities of devices from the ascending semiconductor materials SiC and GaN are discussed. This book presents significant improvements compared to its first edition. It includes chapters on packaging and reliability. The chapter on semiconductor technology is written in a more in-depth way by considering 2D- and high concentration effects. The chapter on IGBTs is extended by new technologies and evaluation of its potential. An extended theory of cosmic ray failures is presented. The range of certain important physical relationships, doubted in recent papers for use in device simulation, is cleared and substantiated in this second edition.
650
0
$a
Power semiconductors.
$3
197819
650
1 4
$a
Engineering.
$3
210888
650
2 4
$a
Circuits and Systems.
$3
274416
650
2 4
$a
Power Electronics, Electrical Machines and Networks.
$3
338660
650
2 4
$a
Energy Systems.
$3
512090
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
274412
700
1
$a
Lutz, Josef.
$3
510698
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-70917-8
950
$a
Engineering (Springer-11647)
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