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Accurate and robust spectral testing...

Chen, Degang.

Accurate and robust spectral testing with relaxed instrumentation requirements

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Accurate and robust spectral testing with relaxed instrumentation requirementsby Yuming Zhuang, Degang Chen.
作者:	Zhuang, Yuming.
其他作者:	Chen, Degang.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xiv, 170 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Measuring instrumentsTesting.
電子資源:	http://dx.doi.org/10.1007/978-3-319-77718-4
ISBN:	9783319777184$q(electronic bk.)

Accurate and robust spectral testing with relaxed instrumentation requirements
Zhuang, Yuming.

Accurate and robust spectral testing with relaxed instrumentation requirements[electronic resource] /by Yuming Zhuang, Degang Chen. - Cham :Springer International Publishing :2018. - xiv, 170 p. :ill., digital ;24 cm.

Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.

This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

ISBN: 9783319777184$q(electronic bk.)

Standard No.: 10.1007/978-3-319-77718-4doiSubjects--Topical Terms:

809554
Measuring instruments
--Testing.

LC Class. No.: TK7868.D5

Dewey Class. No.: 621.38223

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505 0 $a Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.
520 $a This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
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