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Optical characterization of thin sol...

Ohlidal, Miloslav.

Optical characterization of thin solid films

Record Type:	Electronic resources : Monograph/item
Title/Author:	Optical characterization of thin solid filmsedited by Olaf Stenzel, Miloslav Ohlidal.
other author:	Stenzel, Olaf.
Published:	Cham :Springer International Publishing :2018.
Description:	xxiv, 462 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Thin filmsOptical properties.
Online resource:	http://dx.doi.org/10.1007/978-3-319-75325-6
ISBN:	9783319753256$q(electronic bk.)

Optical characterization of thin solid films
Optical characterization of thin solid films[electronic resource] /edited by Olaf Stenzel, Miloslav Ohlidal. - Cham :Springer International Publishing :2018. - xxiv, 462 p. :ill., digital ;24 cm. - Springer series in surface sciences,v.640931-5195 ;. - Springer series in surface sciences ;48..

Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

ISBN: 9783319753256$q(electronic bk.)

Standard No.: 10.1007/978-3-319-75325-6doiSubjects--Topical Terms:

208298
Thin films
--Optical properties.

LC Class. No.: QC176.84.O7 / O685 2018

Dewey Class. No.: 621.38152

Optical characterization of thin solid films
LDR:02498nmm a2200325 a 4500 001 534104
003 DE-He213
005 20181015161449.0
006 m d
007 cr nn 008maaau
008 181205s2018 gw s 0 eng d
020 $a 9783319753256$q(electronic bk.)
020 $a 9783319753249$q(paper)
024 7 $a 10.1007/978-3-319-75325-6 $2 doi
035 $a 978-3-319-75325-6
040 $a GP $c GP
041 0 $a eng
050 4 $a QC176.84.O7 $b O685 2018
072 7 $a PHFC $2 bicssc
072 7 $a SCI077000 $2 bisacsh
082 0 4 $a 621.38152 $2 23
090 $a QC176.84.O7 $b O62 2018
245 0 0 $a Optical characterization of thin solid films $h [electronic resource] / $c edited by Olaf Stenzel, Miloslav Ohlidal.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xxiv, 462 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer series in surface sciences, $x 0931-5195 ; $v v.64
505 0 $a Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
520 $a This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
650 0 $a Thin films $x Optical properties. $3 208298
650 1 4 $a Physics. $3 179414
650 2 4 $a Surface and Interface Science, Thin Films. $3 489822
650 2 4 $a Optical and Electronic Materials. $3 274099
650 2 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Surfaces and Interfaces, Thin Films. $3 274441
700 1 $a Stenzel, Olaf. $3 252934
700 1 $a Ohlidal, Miloslav. $3 810161
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer series in surface sciences ; $v 48. $3 558003
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-75325-6
950 $a Physics and Astronomy (Springer-11651)