國立高雄大學圖資館 |

語系: 繁體中文

說明(常見問題)

圖資館首頁

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Ellipsometry of functional organic s...

Eichhorn, Klaus-Jochen.

Ellipsometry of functional organic surfaces and films

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Ellipsometry of functional organic surfaces and filmsedited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
其他作者:	Hinrichs, Karsten.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xxvi, 547 p. :digital ;24 cm.
Contained By:	Springer eBooks
標題:	Ellipsometry.
電子資源:	http://dx.doi.org/10.1007/978-3-319-75895-4
ISBN:	9783319758954$q(electronic bk.)

Ellipsometry of functional organic surfaces and films
Ellipsometry of functional organic surfaces and films[electronic resource] /edited by Karsten Hinrichs, Klaus-Jochen Eichhorn. - 2nd ed. - Cham :Springer International Publishing :2018. - xxvi, 547 p. :digital ;24 cm. - Springer series in surface sciences,v.520931-5195 ;. - Springer series in surface sciences ;48..

Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

ISBN: 9783319758954$q(electronic bk.)

Standard No.: 10.1007/978-3-319-75895-4doiSubjects--Topical Terms:

217027
Ellipsometry.

LC Class. No.: QC443 / .E455 2018

Dewey Class. No.: 535.52

Ellipsometry of functional organic surfaces and films
LDR:02446nmm a2200337 a 4500 001 539062
003 DE-He213
005 20181206163210.0
006 m d
007 cr nn 008maaau
008 190122s2018 gw s 0 eng d
020 $a 9783319758954$q(electronic bk.)
020 $a 9783319758947$q(paper)
024 7 $a 10.1007/978-3-319-75895-4 $2 doi
035 $a 978-3-319-75895-4
040 $a GP $c GP
041 0 $a eng
050 4 $a QC443 $b .E455 2018
072 7 $a PHFC $2 bicssc
072 7 $a SCI077000 $2 bisacsh
082 0 4 $a 535.52 $2 23
090 $a QC443 $b .E46 2018
245 0 0 $a Ellipsometry of functional organic surfaces and films $h [electronic resource] / $c edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
250 $a 2nd ed.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xxvi, 547 p. : $b digital ; $c 24 cm.
490 1 $a Springer series in surface sciences, $x 0931-5195 ; $v v.52
505 0 $a Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.
520 $a This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
650 0 $a Ellipsometry. $3 217027
650 0 $a Surfaces (Technology) $3 190551
650 1 4 $a Physics. $3 179414
650 2 4 $a Surface and Interface Science, Thin Films. $3 489822
650 2 4 $a Surfaces and Interfaces, Thin Films. $3 274441
650 2 4 $a Physical Chemistry. $3 273698
650 2 4 $a Optics, Lasers, Photonics, Optical Devices. $3 758151
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
700 1 $a Hinrichs, Karsten. $3 675881
700 1 $a Eichhorn, Klaus-Jochen. $3 675882
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer series in surface sciences ; $v 48. $3 558003
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-75895-4
950 $a Physics and Astronomy (Springer-11651)