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Inside solid state drives (SSDs)

Eshghi, Kam.

Inside solid state drives (SSDs)

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Inside solid state drives (SSDs)edited by Rino Micheloni, Alessia Marelli, Kam Eshghi.
其他作者:	Micheloni, Rino.
出版者:	Singapore :Springer Singapore :2018.
面頁冊數:	xxi, 485 p. :digital ;24 cm.
Contained By:	Springer eBooks
標題:	Computer storage devices.
電子資源:	http://dx.doi.org/10.1007/978-981-13-0599-3
ISBN:	9789811305993$q(electronic bk.)

Inside solid state drives (SSDs)
Inside solid state drives (SSDs)[electronic resource] /edited by Rino Micheloni, Alessia Marelli, Kam Eshghi. - 2nd ed. - Singapore :Springer Singapore :2018. - xxi, 485 p. :digital ;24 cm. - Springer series in advanced microelectronics,v.371437-0387 ;. - Springer series in advanced microelectronics ;3..

The revised second edition of this respected text provides a state-of-the-art overview of the main topics relating to solid state drives (SSDs), covering NAND flash memories, memory controllers (including booth hardware and software), I/O interfaces (PCIe/SAS/SATA), reliability, error correction codes (BCH and LDPC), encryption, flash signal processing and hybrid storage. Updated throughout to include all recent work in the field, significant changes for the new edition include: A new chapter on flash memory errors and data recovery procedures in SSDs for reliability and lifetime improvement Updated coverage of SSD Architecture and PCI Express Interfaces moving from PCIe Gen3 to PCIe Gen4 and including a section on NVMe over fabric (NVMf) An additional section on 3D flash memories An update on standard reliability procedures for SSDs Expanded coverage of BCH for SSDs, with a specific section on detection A new section on non-binary Low-Density Parity-Check (LDPC) codes, the most recent advancement in the field A description of randomization in the protection of SSD data against attacks, particularly relevant to 3D architectures The SSD market is booming, with many industries placing a huge effort in this space, spending billions of dollars in R&D and product development. Moreover, flash manufacturers are now moving to 3D architectures, thus enabling an even higher level of storage capacity. This book takes the reader through the fundamentals and brings them up to speed with the most recent developments in the field, and is suitable for advanced students, researchers and engineers alike.

ISBN: 9789811305993$q(electronic bk.)

Standard No.: 10.1007/978-981-13-0599-3doiSubjects--Topical Terms:

202780
Computer storage devices.

LC Class. No.: TK7895.M4 / I575 2018

Dewey Class. No.: 530.41

Inside solid state drives (SSDs)
LDR:02694nmm a2200337 a 4500 001 543247
003 DE-He213
005 20190213102917.0
006 m d
007 cr nn 008maaau
008 190411s2018 si s 0 eng d
020 $a 9789811305993$q(electronic bk.)
020 $a 9789811305986$q(paper)
024 7 $a 10.1007/978-981-13-0599-3 $2 doi
026 5 8 $a nam a2200325 a 4500
035 $a 978-981-13-0599-3
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7895.M4 $b I575 2018
072 7 $a PNFS $2 bicssc
072 7 $a SCI077000 $2 bisacsh
082 0 4 $a 530.41 $2 23
090 $a TK7895.M4 $b I59 2018
245 0 0 $a Inside solid state drives (SSDs) $h [electronic resource] / $c edited by Rino Micheloni, Alessia Marelli, Kam Eshghi.
250 $a 2nd ed.
260 $a Singapore : $b Springer Singapore : $b Imprint: Springer, $c 2018.
300 $a xxi, 485 p. : $b digital ; $c 24 cm.
490 1 $a Springer series in advanced microelectronics, $x 1437-0387 ; $v v.37
520 $a The revised second edition of this respected text provides a state-of-the-art overview of the main topics relating to solid state drives (SSDs), covering NAND flash memories, memory controllers (including booth hardware and software), I/O interfaces (PCIe/SAS/SATA), reliability, error correction codes (BCH and LDPC), encryption, flash signal processing and hybrid storage. Updated throughout to include all recent work in the field, significant changes for the new edition include: A new chapter on flash memory errors and data recovery procedures in SSDs for reliability and lifetime improvement Updated coverage of SSD Architecture and PCI Express Interfaces moving from PCIe Gen3 to PCIe Gen4 and including a section on NVMe over fabric (NVMf) An additional section on 3D flash memories An update on standard reliability procedures for SSDs Expanded coverage of BCH for SSDs, with a specific section on detection A new section on non-binary Low-Density Parity-Check (LDPC) codes, the most recent advancement in the field A description of randomization in the protection of SSD data against attacks, particularly relevant to 3D architectures The SSD market is booming, with many industries placing a huge effort in this space, spending billions of dollars in R&D and product development. Moreover, flash manufacturers are now moving to 3D architectures, thus enabling an even higher level of storage capacity. This book takes the reader through the fundamentals and brings them up to speed with the most recent developments in the field, and is suitable for advanced students, researchers and engineers alike.
650 0 $a Computer storage devices. $3 202780
650 1 4 $a Physics. $3 179414
650 2 4 $a Solid State Physics. $3 376486
650 2 4 $a Circuits and Systems. $3 274416
650 2 4 $a Computer Hardware. $3 275482
700 1 $a Micheloni, Rino. $3 256242
700 1 $a Marelli, Alessia. $3 489583
700 1 $a Eshghi, Kam. $3 821450
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer series in advanced microelectronics ; $v 3. $3 444554
856 4 0 $u http://dx.doi.org/10.1007/978-981-13-0599-3
950 $a Physics and Astronomy (Springer-11651)