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Progress in nanoscale characterizati...

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Progress in nanoscale characterization and manipulation

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Progress in nanoscale characterization and manipulationedited by Rongming Wang ... [et al.].
其他作者:	Wang, Rongming.
出版者:	Singapore :Springer Singapore :2018.
面頁冊數:	vii, 508 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Electron microscopy.
電子資源:	https://doi.org/10.1007/978-981-13-0454-5
ISBN:	9789811304545$q(electronic bk.)

Progress in nanoscale characterization and manipulation
Progress in nanoscale characterization and manipulation[electronic resource] /edited by Rongming Wang ... [et al.]. - Singapore :Springer Singapore :2018. - vii, 508 p. :ill. (some col.), digital ;24 cm. - Springer tracts in modern physics,v.2720081-3869 ;. - Springer tracts in modern physics ;168..

Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy.

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

ISBN: 9789811304545$q(electronic bk.)

Standard No.: 10.1007/978-981-13-0454-5doiSubjects--Topical Terms:

189038
Electron microscopy.

LC Class. No.: QH212.E4 / P764 2018

Dewey Class. No.: 502.825

Progress in nanoscale characterization and manipulation
LDR:02350nmm a2200337 a 4500 001 544091
003 DE-He213
005 20190305135145.0
006 m d
007 cr nn 008maaau
008 190430s2018 si s 0 eng d
020 $a 9789811304545$q(electronic bk.)
020 $a 9789811304538$q(paper)
024 7 $a 10.1007/978-981-13-0454-5 $2 doi
035 $a 978-981-13-0454-5
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.E4 $b P764 2018
072 7 $a TBN $2 bicssc
072 7 $a SCI050000 $2 bisacsh
072 7 $a TBN $2 thema
082 0 4 $a 502.825 $2 23
090 $a QH212.E4 $b P964 2018
245 0 0 $a Progress in nanoscale characterization and manipulation $h [electronic resource] / $c edited by Rongming Wang ... [et al.].
260 $a Singapore : $b Springer Singapore : $b Imprint: Springer, $c 2018.
300 $a vii, 508 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Springer tracts in modern physics, $x 0081-3869 ; $v v.272
505 0 $a Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy.
520 $a This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
650 0 $a Electron microscopy. $3 189038
650 0 $a Nanostructured materials $x Optical properties. $3 229836
650 1 4 $a Nanoscale Science and Technology. $3 489389
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Spectroscopy and Microscopy. $3 376485
700 1 $a Wang, Rongming. $3 822587
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer tracts in modern physics ; $v 168. $3 437915
856 4 0 $u https://doi.org/10.1007/978-981-13-0454-5
950 $a Physics and Astronomy (Springer-11651)