國立高雄大學圖資館 |

語系: 繁體中文

說明(常見問題)

圖資館首頁

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Lock-in thermographybasics and use f...

Breitenstein, Otwin.

Lock-in thermographybasics and use for evaluating electronic devices and materials /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Lock-in thermographyby Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
其他題名:	basics and use for evaluating electronic devices and materials /
作者:	Breitenstein, Otwin.
其他作者:	Warta, Wilhelm.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xxi, 321 p. :ill. (some color), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Electronic apparatus and appliancesThermal properties.
電子資源:	https://doi.org/10.1007/978-3-319-99825-1
ISBN:	9783319998251$q(electronic bk.)

Lock-in thermographybasics and use for evaluating electronic devices and materials /
Breitenstein, Otwin.

Lock-in thermographybasics and use for evaluating electronic devices and materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert. - 3rd ed. - Cham :Springer International Publishing :2018. - xxi, 321 p. :ill. (some color), digital ;24 cm. - Springer series in advanced microelectronics,v.101437-0387 ;. - Springer series in advanced microelectronics ;3..

Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

ISBN: 9783319998251$q(electronic bk.)

Standard No.: 10.1007/978-3-319-99825-1doiSubjects--Topical Terms:

190372
Electronic apparatus and appliances
--Thermal properties.

LC Class. No.: TK7870.25 / .B745 2018

Dewey Class. No.: 621.381548

Lock-in thermographybasics and use for evaluating electronic devices and materials /
LDR:02095nmm a2200361 a 4500 001 546900
003 DE-He213
005 20190514090049.0
006 m d
007 cr nn 008maaau
008 190627s2018 gw s 0 eng d
020 $a 9783319998251$q(electronic bk.)
020 $a 9783319998244$q(paper)
024 7 $a 10.1007/978-3-319-99825-1 $2 doi
035 $a 978-3-319-99825-1
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7870.25 $b .B745 2018
072 7 $a TTBL $2 bicssc
072 7 $a TEC019000 $2 bisacsh
072 7 $a PHJ $2 thema
072 7 $a TTB $2 thema
082 0 4 $a 621.381548 $2 23
090 $a TK7870.25 $b .B835 2018
100 1 $a Breitenstein, Otwin. $3 492253
245 1 0 $a Lock-in thermography $h [electronic resource] : $b basics and use for evaluating electronic devices and materials / $c by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
250 $a 3rd ed.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xxi, 321 p. : $b ill. (some color), digital ; $c 24 cm.
490 1 $a Springer series in advanced microelectronics, $x 1437-0387 ; $v v.10
505 0 $a Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
520 $a This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
650 0 $a Electronic apparatus and appliances $x Thermal properties. $3 190372
650 0 $a Electronic apparatus and appliances $x Testing. $3 263596
650 0 $a Semiconductors $x Thermal properties. $3 347364
650 0 $a Thermography. $3 338563
650 1 4 $a Optics, Lasers, Photonics, Optical Devices. $3 758151
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Microwaves, RF and Optical Engineering. $3 274186
650 2 4 $a Structural Materials. $3 274623
700 1 $a Warta, Wilhelm. $3 492254
700 1 $a Schubert, Martin C. $3 826009
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer series in advanced microelectronics ; $v 3. $3 444554
856 4 0 $u https://doi.org/10.1007/978-3-319-99825-1
950 $a Physics and Astronomy (Springer-11651)