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Spectroscopic ellipsometry for photo...
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Collins, Robert W.
Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Spectroscopic ellipsometry for photovoltaics.edited by Hiroyuki Fujiwara, Robert W. Collins.
其他題名:
Fundamental principles and solar cell characterization
其他作者:
Fujiwara, Hiroyuki.
出版者:
Cham :Springer International Publishing :2018.
面頁冊數:
xx, 594 p. :ill. (some color), digital ;24 cm.
Contained By:
Springer eBooks
標題:
Photovoltaic power generation.
電子資源:
https://doi.org/10.1007/978-3-319-75377-5
ISBN:
9783319753775$q(electronic bk.)
Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization
Spectroscopic ellipsometry for photovoltaics.
Volume 1,Fundamental principles and solar cell characterization[electronic resource] /Fundamental principles and solar cell characterizationedited by Hiroyuki Fujiwara, Robert W. Collins. - Cham :Springer International Publishing :2018. - xx, 594 p. :ill. (some color), digital ;24 cm. - Springer series in optical sciences,v.2120342-4111 ;. - Springer series in optical sciences ;v. 93..
Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
ISBN: 9783319753775$q(electronic bk.)
Standard No.: 10.1007/978-3-319-75377-5doiSubjects--Topical Terms:
184746
Photovoltaic power generation.
LC Class. No.: QC443 / .S643 2018
Dewey Class. No.: 620.11295
Spectroscopic ellipsometry for photovoltaics.Volume 1,Fundamental principles and solar cell characterization
LDR
:03151nmm a2200361 a 4500
001
546901
003
DE-He213
005
20190513160147.0
006
m d
007
cr nn 008maaau
008
190627s2018 gw s 0 eng d
020
$a
9783319753775$q(electronic bk.)
020
$a
9783319753751$q(paper)
024
7
$a
10.1007/978-3-319-75377-5
$2
doi
035
$a
978-3-319-75377-5
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
QC443
$b
.S643 2018
072
7
$a
TTBL
$2
bicssc
072
7
$a
TEC019000
$2
bisacsh
072
7
$a
PHJ
$2
thema
072
7
$a
TTB
$2
thema
082
0 4
$a
620.11295
$2
23
090
$a
QC443
$b
.S741 2018
245
0 0
$a
Spectroscopic ellipsometry for photovoltaics.
$n
Volume 1,
$p
Fundamental principles and solar cell characterization
$h
[electronic resource] /
$c
edited by Hiroyuki Fujiwara, Robert W. Collins.
246
3 0
$a
Fundamental principles and solar cell characterization
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2018.
300
$a
xx, 594 p. :
$b
ill. (some color), digital ;
$c
24 cm.
490
1
$a
Springer series in optical sciences,
$x
0342-4111 ;
$v
v.212
505
0
$a
Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
520
$a
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
650
0
$a
Photovoltaic power generation.
$3
184746
650
1 4
$a
Optics, Lasers, Photonics, Optical Devices.
$3
758151
650
2 4
$a
Optical and Electronic Materials.
$3
274099
650
2 4
$a
Microwaves, RF and Optical Engineering.
$3
274186
650
2 4
$a
Renewable and Green Energy.
$3
309696
650
0
$a
Ellipsometry.
$3
217027
700
1
$a
Fujiwara, Hiroyuki.
$3
826010
700
1
$a
Collins, Robert W.
$3
233766
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer eBooks
830
0
$a
Springer series in optical sciences ;
$v
v. 93.
$3
438651
856
4 0
$u
https://doi.org/10.1007/978-3-319-75377-5
950
$a
Physics and Astronomy (Springer-11651)
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