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Spectroscopic ellipsometry for photo...

Collins, Robert W.

Spectroscopic ellipsometry for photovoltaics.Volume 2,Applications and optical data of solar cell materials

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Spectroscopic ellipsometry for photovoltaics.edited by Hiroyuki Fujiwara, Robert W. Collins.
其他題名:	Applications and optical data of solar cell materials
其他作者:	Fujiwara, Hiroyuki.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xxi, 616 p. :ill. (some color), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Ellipsometry.
電子資源:	https://doi.org/10.1007/978-3-319-95138-6
ISBN:	9783319951386$q(electronic bk.)

Spectroscopic ellipsometry for photovoltaics.Volume 2,Applications and optical data of solar cell materials
Spectroscopic ellipsometry for photovoltaics.Volume 2,Applications and optical data of solar cell materials[electronic resource] /Applications and optical data of solar cell materialsedited by Hiroyuki Fujiwara, Robert W. Collins. - Cham :Springer International Publishing :2018. - xxi, 616 p. :ill. (some color), digital ;24 cm. - Springer series in optical sciences,v.2140342-4111 ;. - Springer series in optical sciences ;v. 93..

Introduction -- Part I: Application of Ellipsometry Technique -- Analysis of Optical and Recombination Losses in Solar Cells -- Optical Simulation of External Quantum Efficiency Spectra -- Characterization of Textured Structures -- On-line Monitoring of Photovoltaics Production -- Real Time Measurement, Monitoring, and Control of CuIn1‑xGaxSe2 by Spectroscopic Ellipsometry -- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells -- Part II: Optical Data of Solar-Cell Component Materials -- Inorganic Semiconductors and Passivation Layers -- Organic Semiconductors -- Organic-Inorganic Hybrid Perovskites -- Transparent Conductive Oxides -- Metals -- Substrates and Coating Layers.

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.

ISBN: 9783319951386$q(electronic bk.)

Standard No.: 10.1007/978-3-319-95138-6doiSubjects--Topical Terms:

217027
Ellipsometry.

LC Class. No.: QC443 / .S643 2018

Dewey Class. No.: 620.11295

Spectroscopic ellipsometry for photovoltaics.Volume 2,Applications and optical data of solar cell materials
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505 0 $a Introduction -- Part I: Application of Ellipsometry Technique -- Analysis of Optical and Recombination Losses in Solar Cells -- Optical Simulation of External Quantum Efficiency Spectra -- Characterization of Textured Structures -- On-line Monitoring of Photovoltaics Production -- Real Time Measurement, Monitoring, and Control of CuIn1‑xGaxSe2 by Spectroscopic Ellipsometry -- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells -- Part II: Optical Data of Solar-Cell Component Materials -- Inorganic Semiconductors and Passivation Layers -- Organic Semiconductors -- Organic-Inorganic Hybrid Perovskites -- Transparent Conductive Oxides -- Metals -- Substrates and Coating Layers.
520 $a Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
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