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Reliability physics and engineeringt...

McPherson, J. W.

Reliability physics and engineeringtime-to-failure modeling /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Reliability physics and engineeringby J. W. McPherson.
其他題名:	time-to-failure modeling /
作者:	McPherson, J. W.
出版者:	Cham :Springer International Publishing :2019.
面頁冊數:	xvii, 463 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Reliability (Engineering)
電子資源:	https://doi.org/10.1007/978-3-319-93683-3
ISBN:	9783319936833$q(electronic bk.)

Reliability physics and engineeringtime-to-failure modeling /
McPherson, J. W.

Reliability physics and engineeringtime-to-failure modeling /[electronic resource] :by J. W. McPherson. - 3rd ed. - Cham :Springer International Publishing :2019. - xvii, 463 p. :ill. (some col.), digital ;24 cm.

Introduction -- Physics of Degradation -- Time Dependence of Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics - An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-To-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- Conversion of Dynamical Stresses Into Effective Static Values -- Resonance and Resonance-Induced Degradation -- Increasing the Reliability of Device/Product Designs -- Screening -- Heat Generation and Dissipation -- Sampling Plans and Confidence Intervals.

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes-- all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases. Provides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications; Explains the fundamentals of reliability physics and engineering tools for building better products; Contains statistical training and tools within the text; Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.

ISBN: 9783319936833$q(electronic bk.)

Standard No.: 10.1007/978-3-319-93683-3doiSubjects--Topical Terms:

182677
Reliability (Engineering)

LC Class. No.: TA169

Dewey Class. No.: 620.00452

Reliability physics and engineeringtime-to-failure modeling /
LDR:03177nmm a2200337 a 4500 001 555593
003 DE-He213
005 20190702170331.0
006 m d
007 cr nn 008maaau
008 191121s2019 gw s 0 eng d
020 $a 9783319936833$q(electronic bk.)
020 $a 9783319936826$q(paper)
024 7 $a 10.1007/978-3-319-93683-3 $2 doi
035 $a 978-3-319-93683-3
040 $a GP $c GP
041 0 $a eng
050 4 $a TA169
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 620.00452 $2 23
090 $a TA169 $b .M172 2019
100 1 $a McPherson, J. W. $3 837770
245 1 0 $a Reliability physics and engineering $h [electronic resource] : $b time-to-failure modeling / $c by J. W. McPherson.
250 $a 3rd ed.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2019.
300 $a xvii, 463 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Introduction -- Physics of Degradation -- Time Dependence of Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics - An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-To-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- Conversion of Dynamical Stresses Into Effective Static Values -- Resonance and Resonance-Induced Degradation -- Increasing the Reliability of Device/Product Designs -- Screening -- Heat Generation and Dissipation -- Sampling Plans and Confidence Intervals.
520 $a This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes-- all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases. Provides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications; Explains the fundamentals of reliability physics and engineering tools for building better products; Contains statistical training and tools within the text; Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.
650 0 $a Reliability (Engineering) $3 182677
650 1 4 $a Circuits and Systems. $3 274416
650 2 4 $a Electronic Circuits and Devices. $3 495609
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 274011
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u https://doi.org/10.1007/978-3-319-93683-3
950 $a Engineering (Springer-11647)