國立高雄大學圖資館 |

語系: 繁體中文

說明(常見問題)

圖資館首頁

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Advanced computing in electron micro...

Kirkland, Earl J.

Advanced computing in electron microscopy

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Advanced computing in electron microscopyby Earl J. Kirkland.
作者:	Kirkland, Earl J.
出版者:	Cham :Springer International Publishing :2020.
面頁冊數:	xii, 354 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Electron microscopyComputer simulation.
電子資源:	https://doi.org/10.1007/978-3-030-33260-0
ISBN:	9783030332600$q(electronic bk.)

Advanced computing in electron microscopy
Kirkland, Earl J.

Advanced computing in electron microscopy[electronic resource] /by Earl J. Kirkland. - Third edition. - Cham :Springer International Publishing :2020. - xii, 354 p. :ill., digital ;24 cm.

Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

ISBN: 9783030332600$q(electronic bk.)

Standard No.: 10.1007/978-3-030-33260-0doiSubjects--Topical Terms:

489366
Electron microscopy
--Computer simulation.

LC Class. No.: QH212.E4 / K575 2020

Dewey Class. No.: 570.2825

Advanced computing in electron microscopy
LDR:02530nmm a2200349 a 4500 001 572910
003 DE-He213
005 20200810120828.0
006 m d
007 cr nn 008maaau
008 200925s2020 sz s 0 eng d
020 $a 9783030332600$q(electronic bk.)
020 $a 9783030332594$q(paper)
024 7 $a 10.1007/978-3-030-33260-0 $2 doi
035 $a 978-3-030-33260-0
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.E4 $b K575 2020
072 7 $a PNFS $2 bicssc
072 7 $a SCI078000 $2 bisacsh
072 7 $a PNFS $2 thema
072 7 $a PDN $2 thema
082 0 4 $a 570.2825 $2 23
090 $a QH212.E4 $b K59 2020
100 1 $a Kirkland, Earl J. $3 489365
245 1 0 $a Advanced computing in electron microscopy $h [electronic resource] / $c by Earl J. Kirkland.
250 $a Third edition.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a xii, 354 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.
520 $a This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
650 0 $a Electron microscopy $x Computer simulation. $3 489366
650 1 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Image Processing and Computer Vision. $3 274051
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Biological Microscopy. $3 273937
650 2 4 $a Spectroscopy/Spectrometry. $3 375491
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u https://doi.org/10.1007/978-3-030-33260-0
950 $a Physics and Astronomy (Springer-11651)