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Proceedings of 2018 International Co...
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Dong, Xinyong.
Proceedings of 2018 International Conference on Optoelectronics and Measurement
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Proceedings of 2018 International Conference on Optoelectronics and Measurementedited by Yingquan Peng, Xinyong Dong.
其他作者:
Peng, Yingquan.
出版者:
Singapore :Springer Singapore :2020.
面頁冊數:
ix, 309 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
OptoelectronicsCongresses.
電子資源:
https://doi.org/10.1007/978-981-13-8595-7
ISBN:
9789811385957$q(electronic bk.)
Proceedings of 2018 International Conference on Optoelectronics and Measurement
Proceedings of 2018 International Conference on Optoelectronics and Measurement
[electronic resource] /edited by Yingquan Peng, Xinyong Dong. - Singapore :Springer Singapore :2020. - ix, 309 p. :ill., digital ;24 cm. - Lecture notes in electrical engineering,v.5671876-1100 ;. - Lecture notes in electrical engineering ;v.132..
Fiber optics and photonics -- Light-emitting devices -- Photo detectors and solar cells -- Gas and physical sensors -- Measurement technology.
This book gathers selected papers from the first International Conference on Optoelectronics and Measurement (ICOM 2018), held in Hangzhou, China on Oct 18-20, 2018. The proceedings focus on the latest developments in the fields of optics, photonics, optoelectronics, sensors, and related measurement technologies. Addressing hot topics in fibre optics, photo detectors and sensors, it also features illustrations of advanced device technologies, explains measurement principles, and shares cutting-edge scientific and technological findings. Accordingly, readers will gain essential insights into the forefront of these fields, and will find not only important technical data, but also new ideas to inspire their own future research.
ISBN: 9789811385957$q(electronic bk.)
Standard No.: 10.1007/978-981-13-8595-7doiSubjects--Topical Terms:
490552
Optoelectronics
--Congresses.
LC Class. No.: TA1750
Dewey Class. No.: 621.381045
Proceedings of 2018 International Conference on Optoelectronics and Measurement
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