紀錄類型: |
書目-電子資源
: Monograph/item
|
正題名/作者: |
Electromigration in metalsPaul S. Ho ... [et al.]. |
其他題名: |
fundamentals to nano-interconnects / |
其他作者: |
Ho, Paul S. |
出版者: |
Cambridge ; New York, NY :Cambridge University Pres,2022. |
面頁冊數: |
xiii, 417 p. :ill., digital ;25 cm. |
附註: |
Title from publisher's bibliographic system (viewed on 07 Apr 2022). |
標題: |
Interconnects (Integrated circuit technology)Materials. |
電子資源: |
https://doi.org/10.1017/9781139505819 |
ISBN: |
9781139505819$q(electronic bk.) |