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Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Vlsi design and testedited by Ambika Prasad Shah ... [et al.].
其他題名:	26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
其他題名:	VDAT 2022
其他作者:	Shah, Ambika Prasad.
團體作者:
出版者:	Cham :Springer Nature Switzerland :2022.
面頁冊數:	xviii, 596 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Integrated circuitsCongresses.Very large scale integration
電子資源:	https://doi.org/10.1007/978-3-031-21514-8
ISBN:	9783031215148$q(electronic bk.)

Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /[electronic resource] :VDAT 2022edited by Ambika Prasad Shah ... [et al.]. - Cham :Springer Nature Switzerland :2022. - xviii, 596 p. :ill. (some col.), digital ;24 cm. - Communications in computer and information science,16871865-0937 ;. - Communications in computer and information science ;229..

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

ISBN: 9783031215148$q(electronic bk.)

Standard No.: 10.1007/978-3-031-21514-8doiSubjects--Topical Terms:

436460
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
LDR:01620nmm a2200337 a 4500 001 633888
003 DE-He213
005 20221216155634.0
006 m d
007 cr nn 008maaau
008 230511s2022 sz s 0 eng d
020 $a 9783031215148$q(electronic bk.)
020 $a 9783031215131$q(paper)
024 7 $a 10.1007/978-3-031-21514-8 $2 doi
035 $a 978-3-031-21514-8
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874.75
072 7 $a UK $2 bicssc
072 7 $a COM067000 $2 bisacsh
072 7 $a UK $2 thema
082 0 4 $a 621.395 $2 23
090 $a TK7874.75 $b .V393 2022
111 2 $n (3rd : $d 1998 : $c Amsterdam, Netherlands) $3 194767
245 1 0 $a Vlsi design and test $h [electronic resource] : $b 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers / $c edited by Ambika Prasad Shah ... [et al.].
246 3 $a VDAT 2022
260 $a Cham : $b Springer Nature Switzerland : $b Imprint: Springer, $c 2022.
300 $a xviii, 596 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Communications in computer and information science, $x 1865-0937 ; $v 1687
520 $a This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
650 0 $a Integrated circuits $x Very large scale integration $x Testing $v Congresses. $3 436460
650 0 $a Integrated circuits $x Very large scale integration $x Design and construction $v Congresses. $3 436462
700 1 $a Shah, Ambika Prasad. $3 940023
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
830 0 $a Communications in computer and information science ; $v 229. $3 547963
856 4 0 $u https://doi.org/10.1007/978-3-031-21514-8
950 $a Computer Science (SpringerNature-11645)