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Enhanced virtual prototyping for heterogeneous systems

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Enhanced virtual prototyping for heterogeneous systemsby Muhammad Hassan, Daniel Große, Rolf Drechsler.
作者:	Hassan, Muhammad.
其他作者:	Grosse, Daniel.
出版者:	Cham :Springer International Publishing :2023.
面頁冊數:	xx, 166 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Systems on a chip.
電子資源:	https://doi.org/10.1007/978-3-031-05574-4
ISBN:	9783031055744$q(electronic bk.)

Enhanced virtual prototyping for heterogeneous systems
Hassan, Muhammad.

Enhanced virtual prototyping for heterogeneous systems[electronic resource] /by Muhammad Hassan, Daniel Große, Rolf Drechsler. - Cham :Springer International Publishing :2023. - xx, 166 p. :ill., digital ;24 cm.

Introduction -- Preliminaries -- AMS Metamorphic Testing Environment -- AMS Enhanced Code Coverage Verification Environment -- AMS Enhanced Functional Coverage Verification Environment -- Digital Early Security Validation -- Conclusion.

This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs) In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security. Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs; Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models; Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs; Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.

ISBN: 9783031055744$q(electronic bk.)

Standard No.: 10.1007/978-3-031-05574-4doiSubjects--Topical Terms:

224012
Systems on a chip.

LC Class. No.: TK7874.888

Dewey Class. No.: 621.3815

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505 0 $a Introduction -- Preliminaries -- AMS Metamorphic Testing Environment -- AMS Enhanced Code Coverage Verification Environment -- AMS Enhanced Functional Coverage Verification Environment -- Digital Early Security Validation -- Conclusion.
520 $a This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs) In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security. Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs; Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models; Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs; Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.
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