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Data Mining and Diagnosing IC Fails /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Data Mining and Diagnosing IC Fails /by Leendert M. Huisman.
Author:
Huisman, Leendert M..
Published:
Boston, MA :Springer Science+Business Media, Inc.,2005.
Description:
v.: digital
Series:
Frontiers in Electronic Testing, ;
Subject:
Electronics
Online resource:
http://dx.doi.org/10.1007/b137446
ISBN:
9780387249933 (paper)
Data Mining and Diagnosing IC Fails /
Huisman, Leendert M..
Data Mining and Diagnosing IC Fails /
[electronic resource] /by Leendert M. Huisman. - Boston, MA :Springer Science+Business Media, Inc.,2005. - v.: digital - Frontiers in Electronic Testing, ;31,0929-1296 ;.
ISBN: 9780387249933 (paper)Subjects--Topical Terms:
252955
Electronics
LC Class. No.: TK7874 / .H85 2005
Dewey Class. No.: 621.3815/48
Data Mining and Diagnosing IC Fails /
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Engineering (Springer-11647; ZDB-2-ENG)
based on 0 review(s)
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000000003604
電子館藏
1圖書
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EB TK7874 H899 2005
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1 records • Pages 1 •
1
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http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1007/b137446
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