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A beginners' guide to scanning elect...

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A beginners' guide to scanning electron microscopy

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	A beginners' guide to scanning electron microscopyby Anwar Ul-Hamid.
作者:	Ul-Hamid, Anwar.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xxii, 402 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Scanning electron microscopy.
電子資源:	https://doi.org/10.1007/978-3-319-98482-7
ISBN:	9783319984827$q(electronic bk.)

A beginners' guide to scanning electron microscopy
Ul-Hamid, Anwar.

A beginners' guide to scanning electron microscopy[electronic resource] /by Anwar Ul-Hamid. - Cham :Springer International Publishing :2018. - xxii, 402 p. :ill., digital ;24 cm.

Introduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation.

ISBN: 9783319984827$q(electronic bk.)

Standard No.: 10.1007/978-3-319-98482-7doiSubjects--Topical Terms:

242518
Scanning electron microscopy.

LC Class. No.: QH212.S3 / U443 2018

Dewey Class. No.: 502.825

A beginners' guide to scanning electron microscopy
LDR:01111nmm a2200313 a 4500 001 545565
003 DE-He213
005 20190321172629.0
006 m d
007 cr nn 008maaau
008 190530s2018 gw s 0 eng d
020 $a 9783319984827$q(electronic bk.)
020 $a 9783319984810$q(paper)
024 7 $a 10.1007/978-3-319-98482-7 $2 doi
035 $a 978-3-319-98482-7
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.S3 $b U443 2018
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
072 7 $a TGMT $2 thema
082 0 4 $a 502.825 $2 23
090 $a QH212.S3 $b U36 2018
100 1 $a Ul-Hamid, Anwar. $3 824558
245 1 2 $a A beginners' guide to scanning electron microscopy $h [electronic resource] / $c by Anwar Ul-Hamid.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xxii, 402 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation.
650 0 $a Scanning electron microscopy. $3 242518
650 1 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Nanotechnology and Microengineering. $3 348421
650 2 4 $a Biological Microscopy. $3 273937
650 2 4 $a Nanotechnology. $3 193873
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u https://doi.org/10.1007/978-3-319-98482-7
950 $a Chemistry and Materials Science (Springer-11644)