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Digital logic testing and simulation /

~

Miczo, Alexander.

Digital logic testing and simulation /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Digital logic testing and simulation /Alexander Miczo.
作者:	Miczo, Alexander.
出版者:	Hoboken, NJ :Wiley-Interscience,c2003.
面頁冊數:	xxii, 668 p. :ill. ;25 cm.
標題:	Digital electronicsTesting.
電子資源:	http://www.loc.gov/catdir/toc/wiley032/2003041100.html
電子資源:	http://www.loc.gov/catdir/description/wiley039/2003041100.html
ISBN:	0471439959 :

Digital logic testing and simulation /
Miczo, Alexander.

Digital logic testing and simulation /Alexander Miczo. - 2nd ed. - Hoboken, NJ :Wiley-Interscience,c2003. - xxii, 668 p. :ill. ;25 cm.

Includes bibliographical references and index.

ISBN: 0471439959 :NT1400

LCCN: 2003041100Subjects--Topical Terms:

224704
Digital electronics
--Testing.

LC Class. No.: TK7868.D5 / M49 2003

Dewey Class. No.: 621.3815/48

Digital logic testing and simulation /
LDR:00870cam 2200217 a 450 001 161126
003 DLC
005 20051211135127.0
008 090528s2003 njua b 001 0 eng
010 $a 2003041100
020 $a 0471439959 : $c NT1400
035 $a 00147351
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7868.D5 $b M49 2003
082 0 0 $2 21 $a 621.3815/48
100 $a Miczo, Alexander. $3 224703
245 1 0 $a Digital logic testing and simulation / $c Alexander Miczo.
250 $a 2nd ed.
260 $a Hoboken, NJ : $c c2003. $b Wiley-Interscience,
300 $a xxii, 668 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references and index.
650 $a Digital electronics $x Testing. $3 224704
856 4 1 $3 Table of contents $u http://www.loc.gov/catdir/toc/wiley032/2003041100.html $z http://www.loc.gov/catdir/toc/wiley032/2003041100.html
856 4 2 $3 Publisher description $u http://www.loc.gov/catdir/description/wiley039/2003041100.html $z http://www.loc.gov/catdir/description/wiley039/2003041100.html

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http://www.loc.gov/catdir/toc/wiley032/2003041100.html
http://www.loc.gov/catdir/description/wiley039/2003041100.html

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