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Defects at oxide surfaces

Jupille, Jacques.

Defects at oxide surfaces

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Defects at oxide surfacesedited by Jacques Jupille, Geoff Thornton.
其他作者:	Jupille, Jacques.
出版者:	Cham :Springer International Publishing :2015.
面頁冊數:	xvi, 462 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	OxidesDefects.
電子資源:	http://dx.doi.org/10.1007/978-3-319-14367-5
ISBN:	9783319143675 (electronic bk.)

Defects at oxide surfaces
Defects at oxide surfaces[electronic resource] /edited by Jacques Jupille, Geoff Thornton. - Cham :Springer International Publishing :2015. - xvi, 462 p. :ill. (some col.), digital ;24 cm. - Springer series in surface sciences,v.580931-5195 ;. - Springer series in surface sciences ;48..

From the Contents: Numerical simulations of defective structures -- Modeling oxygen vacancies -- Role of surface defects in photocatalysis -- Chemical activity of defects -- Nature of defects as determined by scanning probe tip-surface interactions.

This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.

ISBN: 9783319143675 (electronic bk.)

Standard No.: 10.1007/978-3-319-14367-5doiSubjects--Topical Terms:

714529
Oxides
--Defects.

LC Class. No.: QD181.O1

Dewey Class. No.: 549.5

Defects at oxide surfaces
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520 $a This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.
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