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Radiation hardened CMOS integrated c...

Leroux, Paul.

Radiation hardened CMOS integrated circuits for time-based signal processing

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Radiation hardened CMOS integrated circuits for time-based signal processingby Jeffrey Prinzie, Michiel Steyaert, Paul Leroux.
作者:	Prinzie, Jeffrey.
其他作者:	Steyaert, Michiel.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xxv, 183 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Metal oxide semiconductors, Complementary.
電子資源:	http://dx.doi.org/10.1007/978-3-319-78616-2
ISBN:	9783319786162$q(electronic bk.)

Radiation hardened CMOS integrated circuits for time-based signal processing
Prinzie, Jeffrey.

Radiation hardened CMOS integrated circuits for time-based signal processing[electronic resource] /by Jeffrey Prinzie, Michiel Steyaert, Paul Leroux. - Cham :Springer International Publishing :2018. - xxv, 183 p. :ill., digital ;24 cm. - Analog circuits and signal processing,1872-082X. - Analog circuits and signal processing..

Introduction -- Radiation Effects in CMOS Technology -- Time-Domain Signal Processing -- Clock Synthesizers -- Single Shot Time-to-Digital Converters -- Low Jitter Clock Generators -- Radiation experiments on CMOS PLLs -- Radiation Hard Frequency Synthesizers -- Conclusion.

This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data.

ISBN: 9783319786162$q(electronic bk.)

Standard No.: 10.1007/978-3-319-78616-2doiSubjects--Topical Terms:

184467
Metal oxide semiconductors, Complementary.

LC Class. No.: TK7871.99.M44 / P756 2018

Dewey Class. No.: 621.3815

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